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name:-0.023260116577148
name:-0.0082850456237793
name:-0.014087200164795
ZHAI; Yujia Patent Filings

ZHAI; Yujia

Patent Applications and Registrations

Patent applications and USPTO patent grants for ZHAI; Yujia.The latest application filed is for "process to reduce plasma induced damage".

Company Profile
12.6.18
  • ZHAI; Yujia - Fremont CA
  • ZHAI; Yujia - Beijing CN
  • Zhai; Yujia - Wuhan CN
  • Zhai; Yujia - Wuhan City Hubei
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Process To Reduce Plasma Induced Damage
App 20220293793 - LI; Jianheng ;   et al.
2022-09-15
Process to reduce plasma induced damage
Grant 11,380,801 - Li , et al. July 5, 2
2022-07-05
High-k Dielectric Materials Comprising Zirconium Oxide Utilized In Display Devices
App 20220130873 - RUI; Xiangxin ;   et al.
2022-04-28
High-k dielectric materials comprising zirconium oxide utilized in display devices
Grant 11,239,258 - Rui , et al. February 1, 2
2022-02-01
Hybrid High-k Dielectric Material Film Stacks Comprising Zirconium Oxide Utilized In Display Devices
App 20220013547 - RUI; Xiangxin ;   et al.
2022-01-13
Hybrid high-k dielectric material film stacks comprising zirconium oxide utilized in display devices
Grant 11,145,683 - Rui , et al. October 12, 2
2021-10-12
Layer Stack For Display Applications
App 20210288084 - RUI; Xiangxin ;   et al.
2021-09-16
Layer stack for display applications
Grant 11,049,887 - Rui , et al. June 29, 2
2021-06-29
Thin-Film Transistor Optical Imaging System with Integrated Optics for Through-Display Biometric Imaging
App 20210089741 - Yeh; Po-Chun ;   et al.
2021-03-25
Smartbac Baculovirus Expression System And Application Thereof
App 20210062219 - ZHAI; Yujia ;   et al.
2021-03-04
Process To Reduce Plasma Induced Damage
App 20200395485 - Li; Jianheng ;   et al.
2020-12-17
Narrow linewidth semiconductor laser based on single-wavelength narrowband optical filtering assembly frequency selection
Grant 10,826,273 - Tang , et al. November 3, 2
2020-11-03
Process to reduce plasma induced damage
Grant 10,804,408 - Li , et al. October 13, 2
2020-10-13
High-k Dielectric Materials Comprising Zirconium Oxide Utilized In Display Devices
App 20200258918 - A1
2020-08-13
High-k Gate Insulator For A Thin-film Transistor
App 20200083052 - ZHAI; Yujia ;   et al.
2020-03-12
Narrow Linewidth Semiconductor Laser Based On Single-Wavelength Narrowband Optical Filtering Assembly Frequency Selection
App 20190312409 - Tang; Yi ;   et al.
2019-10-10
High-k Gate Insulator For A Thin-film Transistor
App 20190206691 - ZHAI; Yujia ;   et al.
2019-07-04
Layer Stack For Display Applications
App 20190148416 - RUI; Xiangxin ;   et al.
2019-05-16
Process To Reduce Plasma Induced Damage
App 20190115475 - LI; Jianheng ;   et al.
2019-04-18
Selective In-situ Cleaning Of High-k Films From Processing Chamber Using Reactive Gas Precursor
App 20180350571 - ZHAI; Yujia ;   et al.
2018-12-06
Selective In-situ Cleaning Of High-k Films From Processing Chamber Using Reactive Gas Precursor
App 20180345330 - ZHAI; Yujia ;   et al.
2018-12-06
Selective In-situ Cleaning Of High-k Films From Processing Chamber Using Reactive Gas Precursor
App 20180347037 - ZHAI; Yujia ;   et al.
2018-12-06
Hybrid High-k Dielectric Material Film Stacks Comprising Zirconium Oxide Utilized In Display Devices
App 20180026054 - RUI; Xiangxin ;   et al.
2018-01-25
Hybrid High-k Dielectric Material Film Stacks Comprising Zirconium Oxide Utilized In Display Devices
App 20180026055 - RUI; Xiangxin ;   et al.
2018-01-25

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