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Device and method for the measurement of the curvature of a surface Grant 7,505,150 - Zettler , et al. March 17, 2 | 2009-03-17 |
Method and device for testing an integrated circuit, integrated circuit to be tested, and wafer with a large number of integrated circuits to be tested Grant 7,424,657 - Zettler September 9, 2 | 2008-09-09 |
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