Zemer; Dan
Patent Applications and Registrations
Patent applications and USPTO patent grants for Zemer; Dan.The latest application filed is for "system for imaging andmonitoring fluids".
- Zemer; Dan - Rehovot IL
| Patent | Date |
|---|---|
| System For Imaging Andmonitoring Fluids App 20220032299 - Zemer; Dan ; et al. | 2022-02-03 |
| Method and system for the detections of biological objects Grant 9,046,476 - Zemer , et al. June 2, 2 | 2015-06-02 |
| Method And System For The Detections Of Biological Objects App 20130071875 - Zemer; Dan ; et al. | 2013-03-21 |
| Directional Radiation Detector App 20110237941 - Shahar; Arie ; et al. | 2011-09-29 |
| Tilting device Grant 7,598,688 - Slor , et al. October 6, 2 | 2009-10-06 |
| Tilting device App 20080028816 - Slor; Yechiel ; et al. | 2008-02-07 |
| Electrical circuit conductor inspection Grant 7,006,212 - Savareigo , et al. February 28, 2 | 2006-02-28 |
| Apparatus and method for electrical testing of electrical circuits Grant 6,973,406 - Zemer , et al. December 6, 2 | 2005-12-06 |
| Electrical circuit conductor inspection App 20050134842 - Savareigo, Nissim ; et al. | 2005-06-23 |
| Electrical circuit conductor inspection Grant 6,870,611 - Savareigo , et al. March 22, 2 | 2005-03-22 |
| Apparatus and method for electrical testing of electrical circuits Grant 6,834,243 - Zemer , et al. December 21, 2 | 2004-12-21 |
| Apparatus and method for electrical testing of electrical circuits App 20040140825 - Zemer, Dan ; et al. | 2004-07-22 |
| System and method for multi-dimensional optical inspection Grant 6,654,115 - Zemer , et al. November 25, 2 | 2003-11-25 |
| Electrical circuit conductor inspection App 20030020905 - Savareigo, Nissim ; et al. | 2003-01-30 |
| System For Forming Bumps On Wafers App 20020096555 - Waxler, Scott Steven ; et al. | 2002-07-25 |
| System and method for multi-dimensional optical inspection App 20020093650 - Zemer, Dan ; et al. | 2002-07-18 |
| Apparatus and method for electrical testing of electrical circuits App 20020013667 - Zemer, Dan ; et al. | 2002-01-31 |
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