Zawaideh; Emad
Patent Applications and Registrations
Patent applications and USPTO patent grants for Zawaideh; Emad.The latest application filed is for "imaging spectropolarimeter".
- Zawaideh; Emad - Carlsbad CA
- Zawaideh; Emad - Calsbad CA
- Zawaideh; Emad - Encinitas CA
| Patent | Date |
|---|---|
| Imaging Spectropolarimeter App 20200191657 - Zawaideh; Mazen ; et al. | 2020-06-18 |
| Imaging spectropolarimeter App 20160076942 - Zawaideh; Mazen ; et al. | 2016-03-17 |
| Optical metrology systems and methods Grant 8,319,966 - Zawaideh , et al. November 27, 2 | 2012-11-27 |
| Optical Metrology Systems And Methods App 20090174883 - Zawaideh; Emad ; et al. | 2009-07-09 |
| Optical metrology systems and methods Grant 7,505,133 - Zawaideh , et al. March 17, 2 | 2009-03-17 |
| Nondestructive optical technique for simultaneously measuring optical constants and thickness of thin films Grant 7,463,355 - Zawaideh December 9, 2 | 2008-12-09 |
| Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films Grant 5,999,267 - Zawaideh December 7, 1 | 1999-12-07 |
| Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films Grant 5,889,592 - Zawaideh March 30, 1 | 1999-03-30 |
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