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Patent applications and USPTO patent grants for Zavadsky; Vyacheslav L..The latest application filed is for "integrated circuit analysis systems and methods".
Patent | Date |
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Integrated circuit analysis systems and methods Grant 8,701,058 - Zavadsky , et al. April 15, 2 | 2014-04-15 |
Method of local tracing of connectivity and schematic representations produced therefrom Grant 8,606,041 - Keyes , et al. December 10, 2 | 2013-12-10 |
Integrated circuit characterisation system and method Grant 7,899,640 - Zavadsky , et al. March 1, 2 | 2011-03-01 |
Method of design analysis of existing integrated circuits Grant 7,873,203 - Zavadsky , et al. January 18, 2 | 2011-01-18 |
Integrated Circuit Analysis Systems And Methods App 20100325593 - Zavadsky; Vyacheslav L. ;   et al. | 2010-12-23 |
Method and apparatus for removing uneven brightness in an image Grant 7,751,643 - Zavadsky , et al. July 6, 2 | 2010-07-06 |
Integrated Circuit Characterisation System And Method App 20100030497 - Zavadsky; Vyacheslav L. ;   et al. | 2010-02-04 |
Method of design analysis of existing integrated circuits Grant 7,643,665 - Zavadsky , et al. January 5, 2 | 2010-01-05 |
Method of design analysis of existing integrated circuits Grant 7,580,557 - Zavadsky , et al. August 25, 2 | 2009-08-25 |
Method Of Local Tracing Of Connectivity And Schematic Representations Produced Therefrom App 20090092285 - Keyes; Edward ;   et al. | 2009-04-09 |
Method of Design Analysis of Existing Integrated Circuits App 20080317328 - Zavadsky; Vyacheslav L. ;   et al. | 2008-12-25 |
Method of Design Analysis of Existing Integrated Circuits App 20080317327 - Zavadsky; Vyacheslav L. ;   et al. | 2008-12-25 |
Net-list organization tools App 20070256037 - Zavadsky; Vyacheslav L. ;   et al. | 2007-11-01 |
Method and apparatus for locating short circuit faults in an integrated circuit layout Grant 7,207,018 - Zavadsky , et al. April 17, 2 | 2007-04-17 |
Method of design analysis of existing integrated circuits App 20060045325 - Zavadsky; Vyacheslav L. ;   et al. | 2006-03-02 |
Method and apparatus for removing uneven brightness in an image App 20060034540 - Zavadsky; Vyacheslav L. ;   et al. | 2006-02-16 |
Method and apparatus for locating short circuit faults in an integrated circuit layout App 20060031792 - Zavadsky; Vyacheslav L. ;   et al. | 2006-02-09 |
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