Zaidi; Shoaib

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zaidi; Shoaib.The latest application filed is for "memory device including an electrode having an outer portion with greater resistivity".

Company Profile

0.6.11

Zaidi; Shoaib - Mechanicsville VA
Zaidi; Shoaib - Poughkeepsie NY
Zaidi, Shoaib - US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Memory device including an electrode having an outer portion with greater resistivity Grant 8,189,374 - Zaidi May 29, 2	2012-05-29
Method of fabricating an integrated circuit having a memory including a low-k dielectric material Grant 7,824,951 - Happ , et al. November 2, 2	2010-11-02
Memory Device Including an Electrode Having an Outer Portion With Greater Resistivity App 20100265763 - Zaidi; Shoaib	2010-10-21
Integrated circuit including an electrode having an outer portion with greater resistivity Grant 7,760,546 - Zaidi July 20, 2	2010-07-20
Integrated circuit fabricated using an oxidized polysilicon mask Grant 7,718,464 - Zaidi May 18, 2	2010-05-18
Integrated Circuit Including An Electrode Having An Outer Portion With Greater Resistivity App 20090219755 - Zaidi; Shoaib	2009-09-03
Integrated Circuit Fabricated Using An Oxidized Polysilicon Mask App 20090218556 - Zaidi; Shoaib	2009-09-03
Integrated Circuit With Optical Switch App 20080285912 - Zaidi; Shoaib	2008-11-20
Method Of Fabricating An Integrated Circuit Having A Memory Including A Low-k Dielectric Material App 20080158943 - Happ; Thomas ; et al.	2008-07-03
Integrated circuit having a memory including a low-k dielectric material for thermal isolation Grant 7,361,925 - Happ , et al. April 22, 2	2008-04-22
Memory cell having active region sized for low reset current and method of fabricating such memory cells App 20080012079 - Zaidi; Shoaib	2008-01-17
Memory device App 20070267618 - Zaidi; Shoaib ; et al.	2007-11-22
Semiconductor wafer having measurement area feature for determining dielectric layer thickness App 20070178611 - Zaidi; Shoaib	2007-08-02
Mask-less method of forming aligned semiconductor wafer features App 20070092810 - Zaidi; Shoaib	2007-04-26
Phase change memory cell with high read margin at low power operation App 20060175596 - Happ; Thomas ; et al.	2006-08-10
System and method for quantifying errors in an alternating phase shift mask Grant 7,016,027 - Butt , et al. March 21, 2	2006-03-21
System and method for quantifying errors in an alternating phase shift mask App 20040223145 - Butt, Shahid ; et al.	2004-11-11

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