ZACHAROPOULOU; Thomai
Patent Applications and Registrations
Patent applications and USPTO patent grants for ZACHAROPOULOU; Thomai.The latest application filed is for "method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targets".
- ZACHAROPOULOU; Thomai - Eindhoven NL
| Patent | Date |
|---|---|
| Method Of Determining Information About A Patterning Process, Method Of Reducing Error In Measurement Data, Method Of Calibrating A Metrology Process, Method Of Selecting Metrology Targets App 20210255552 - VENSELAAR; Joannes Jitse ; et al. | 2021-08-19 |
| Method Of Determining Information About A Patterning Process, Method Of Reducing Error In Measurement Data, Method Of Calibrating A Metrology Process, Method Of Selecting Metrology Targets App 20210191280 - Medvedyeva; Mariya Vyacheslavivna ; et al. | 2021-06-24 |
| Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targets Grant 11,022,897 - Venselaar , et al. June 1, 2 | 2021-06-01 |
| Method Of Determining Information About A Patterning Process, Method Of Reducing Error In Measurement Data, Method Of Calibratin App 20190171115 - VENSELAAR; Joannes Jitse ; et al. | 2019-06-06 |
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