Zach; Franz Xaver

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zach; Franz Xaver.The latest application filed is for "optical lithography correction process".

Company Profile

0.9.10

Zach; Franz Xaver - Los Gatos CA
Zach; Franz Xaver - Wappingers Falls NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical lithography correction process Grant 8,141,008 - Zach March 20, 2	2012-03-20
Optical Lithography Correction Process App 20110154281 - Zach; Franz Xaver	2011-06-23
Optical lithography correction process Grant 7,882,456 - Zach February 1, 2	2011-02-01
Method for interlayer and yield based optical proximity correction Grant 7,861,209 - Zach December 28, 2	2010-12-28
Method for interlayer and yield based optical proximity correction Grant 7,712,069 - Zach May 4, 2	2010-05-04
Method for verifying and choosing lithography model Grant 7,536,670 - Percin , et al. May 19, 2	2009-05-19
Systems And Methods For Electrical Characterization Of Inter-layer Alignment App 20090033353 - Yu; Kaung Shia ; et al.	2009-02-05
Method for real time monitoring and verifying optical proximity correction model and method Grant 7,392,502 - Percin , et al. June 24, 2	2008-06-24
Method For Interlayer And Yield Based Optical Proximity Correction App 20080086715 - Zach; Franz Xaver	2008-04-10
Method for interlayer and yield based optical proximity correction Grant 7,334,212 - Zach February 19, 2	2008-02-19
Method For Interlayer And Yield Based Optical Proximity Correction App 20080022255 - Zach; Franz Xaver	2008-01-24
Method for measuring and verifying stepper illumination Grant 7,224,437 - Percin , et al. May 29, 2	2007-05-29
Method for real time monitoring and verifying optical proximity correction model and method App 20070006116 - Percin; Gokhan ; et al.	2007-01-04
Method for verifying and choosing lithography model App 20060282814 - Percin; Gokhan ; et al.	2006-12-14
Method for measuring and verifying stepper illumination App 20060268254 - Percin; Gokhan ; et al.	2006-11-30
Optical lithography correction process App 20060236271 - Zach; Franz Xaver	2006-10-19
Method for interlayer and yield based optical proximity correction App 20060031809 - Zach; Franz Xaver	2006-02-09
Method for interlayer and yield based optical proximity correction Grant 6,961,920 - Zach November 1, 2	2005-11-01
Method for interlayer and yield based optical proximity correction App 20050066300 - Zach, Franz Xaver	2005-03-24

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