loadpatents
name:-0.0085048675537109
name:-0.0086028575897217
name:-0.00081110000610352
Zach; Franz X. Patent Filings

Zach; Franz X.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zach; Franz X..The latest application filed is for "method of compensating photomask data for the effects of etch and lithography processes".

Company Profile
0.8.8
  • Zach; Franz X. - Los Gatos CA
  • Zach; Franz X. - Santa Clara CA
  • Zach; Franz X. - Wappingers Falls NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of compensating photomask data for the effects of etch and lithography processes
Grant 7,600,212 - Zach , et al. October 6, 2
2009-10-06
Method and system for reducing the impact of across-wafer variations on critical dimension measurements
Grant 7,588,868 - Zach , et al. September 15, 2
2009-09-15
Calibration on wafer sweet spots
Grant 7,444,615 - Percin , et al. October 28, 2
2008-10-28
Method for correcting position-dependent distortions in patterning of integrated circuits
Grant 7,246,343 - Joshi , et al. July 17, 2
2007-07-17
Method of compensating photomask data for the effects of etch and lithography processes
App 20070143733 - Zach; Franz X. ;   et al.
2007-06-21
Characterizing flare of a projection lens
Grant 7,189,481 - Wu , et al. March 13, 2
2007-03-13
Calibration on wafer sweet spots
App 20060266243 - Percin; Gokhan ;   et al.
2006-11-30
Alternating phase-shift mask rule compliant IC design
Grant 7,124,396 - Zach October 17, 2
2006-10-17
Method and system for reducing the impact of across-wafer variations on critical dimension measurements
App 20060073686 - Zach; Franz X. ;   et al.
2006-04-06
Method for characterization of the illuminator in a lithographic system
App 20060072097 - Zach; Franz X. ;   et al.
2006-04-06
Characterizing flare of a projection lens
App 20060046167 - Wu; Bo ;   et al.
2006-03-02
Method for correcting position-dependent distortions in patterning of integrated circuits
App 20060048091 - Joshi; Devendra ;   et al.
2006-03-02
Alternating Phase-shift Mask Rule Compliant Ic Design
App 20050210436 - Zach, Franz X.
2005-09-22
Process to suppress lithography at a wafer edge
Grant 6,927,172 - Bergner , et al. August 9, 2
2005-08-09
Process to suppress lithography at a wafer edge
App 20040166677 - Bergner, Wolfgang ;   et al.
2004-08-26
Method for producing constant profile sidewalls
Grant 6,132,940 - Mih , et al. October 17, 2
2000-10-17

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed