loadpatents
name:-0.0079200267791748
name:-0.0078809261322021
name:-0.00040006637573242
Zach; Franz Patent Filings

Zach; Franz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zach; Franz.The latest application filed is for "system and method for determining post bonding overlay".

Company Profile
0.6.6
  • Zach; Franz - Los Gatos CA
  • Zach; Franz - Wappingers Falls NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System And Method For Determining Post Bonding Overlay
App 20220187718 - Zach; Franz ;   et al.
2022-06-16
Systems and methods for controlling an etch process
Grant 10,386,829 - Zach A
2019-08-20
Systems and Methods for Controlling an Etch Process
App 20170084473 - Zach; Franz
2017-03-23
Selective silicon-on-insulator isolation structure and method
Grant 7,923,786 - Steegen , et al. April 12, 2
2011-04-12
Yield based retargeting for semiconductor design flow
Grant 7,784,019 - Zach August 24, 2
2010-08-24
Selective Silicon-on-insulator Isolation Structure And Method
App 20080029818 - Steegen; An L. ;   et al.
2008-02-07
Selective silicon-on-insulator isolation structure and method
Grant 7,326,983 - Steegen , et al. February 5, 2
2008-02-05
Selective silicon-on-insulator isolation structure and method
Grant 6,936,522 - Steegen , et al. August 30, 2
2005-08-30
Selective silicon-on-insulator isolation structure and method
App 20050164468 - Steegen, An L. ;   et al.
2005-07-28
Selective Silicon-on-insulator Isolation Structure And Method
App 20040262695 - Steegan, An L. ;   et al.
2004-12-30
Method And Apparatus For Reducing Non-uniformity Area Effects In The Manufacture Of Semiconductor Devices
App 20010003033 - SCHULZE, STEFFEN ;   et al.
2001-06-07
Contact and deep trench patterning
Grant 6,204,187 - Rupp , et al. March 20, 2
2001-03-20

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