loadpatents
name:-0.032201051712036
name:-0.025177955627441
name:-0.007357120513916
Zable; Harold Robert Patent Filings

Zable; Harold Robert

Patent Applications and Registrations

Patent applications and USPTO patent grants for Zable; Harold Robert.The latest application filed is for "method and system for determining a charged particle beam exposure for a local pattern density".

Company Profile
6.23.30
  • Zable; Harold Robert - Palo Alto CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method And System For Determining A Charged Particle Beam Exposure For A Local Pattern Density
App 20210313143 - Fujimura; Akira ;   et al.
2021-10-07
Bias correction for lithography
Grant 11,126,085 - Zable September 21, 2
2021-09-21
Method and system for determining a charged particle beam exposure for a local pattern density
Grant 11,062,878 - Fujimura , et al. July 13, 2
2021-07-13
Method And System Of Reducing Charged Particle Beam Write Time
App 20210208569 - Fujimura; Akira ;   et al.
2021-07-08
Method And System Of Reducing Charged Particle Beam Write Time
App 20210116884 - Fujimura; Akira ;   et al.
2021-04-22
Method and system of reducing charged particle beam write time
Grant 10,884,395 - Fujimura , et al. January 5, 2
2021-01-05
Method And System For Determining A Charged Particle Beam Exposure For A Local Pattern Density
App 20200373122 - Fujimura; Akira ;   et al.
2020-11-26
Bias Correction For Lithography
App 20200341380 - Zable; Harold Robert
2020-10-29
Method and system for determining a charged particle beam exposure for a local pattern density
Grant 10,748,744 - Fujimura , et al. A
2020-08-18
Bias correction for lithography
Grant 10,725,383 - Zable
2020-07-28
Method And System Of Reducing Charged Particle Beam Write Time
App 20200201286 - Fujimura; Akira ;   et al.
2020-06-25
Bias Correction For Lithography
App 20200012195 - Zable; Harold Robert
2020-01-09
Shaped beam lithography including temperature effects
Grant 10,460,071 - Fujimura , et al. Oc
2019-10-29
Bias correction for lithography
Grant 10,444,629 - Zable Oc
2019-10-15
Method And System For Forming Patterns Using Charged Particle Beam Lithography With Variable Pattern Dosage
App 20180374675 - Fujimura; Akira ;   et al.
2018-12-27
Bias Correction For Lithography
App 20170371246 - Zable; Harold Robert
2017-12-28
Method and System for Forming Patterns Using Charged Particle Beam Lithography with Variable Pattern Dosage
App 20170213698 - Fujimura; Akira ;   et al.
2017-07-27
Method And System For Forming Patterns Using Shaped Beam Lithography Including Temperature Effects
App 20170124247 - Fujimura; Akira ;   et al.
2017-05-04
Method and system for forming patterns using charged particle beam lithography with variable pattern dosage
Grant 9,625,809 - Fujimura , et al. April 18, 2
2017-04-18
Method and System for Forming Patterns Using Charged Particle Beam Lithography with Variable Pattern Dosage
App 20160299422 - Fujimura; Akira ;   et al.
2016-10-13
Method and system for forming patterns using charged particle beam lithography with variable pattern dosage
Grant 9,372,391 - Fujimura , et al. June 21, 2
2016-06-21
Method And System For Forming Patterns Using Charged Particle Beam Lithography With Variable Pattern Dosage
App 20150331991 - Fujimura; Akira ;   et al.
2015-11-19
Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes with different dosages
Grant 8,895,212 - Zable , et al. November 25, 2
2014-11-25
Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes
Grant 8,883,375 - Zable , et al. November 11, 2
2014-11-11
Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes which expose different surface area
Grant 8,771,906 - Zable , et al. July 8, 2
2014-07-08
Method for design and manufacture of patterns with variable shaped beam lithography
Grant 8,592,108 - Fujimura , et al. November 26, 2
2013-11-26
Method And System For Forming A Pattern Using Charged Particle Beam Lithography With Multiple Exposure Passes
App 20130309610 - Zable; Harold Robert ;   et al.
2013-11-21
Method And System For Forming A Pattern Using Charged Particle Beam Lithography With Multiple Exposure Passes With Different Dosages
App 20130309608 - Zable; Harold Robert ;   et al.
2013-11-21
Method And System For Forming A Pattern Using Charged Particle Beam Lithography With Multiple Exposure Passes Which Expose Different Surface Area
App 20130309609 - Zable; Harold Robert ;   et al.
2013-11-21
Method and system for fracturing a pattern using lithography with multiple exposure passes
Grant 8,492,055 - Zable , et al. July 23, 2
2013-07-23
Method For Design And Manufacture Of Patterns With Variable Shaped Beam Lithography
App 20130101941 - Fujimura; Akira ;   et al.
2013-04-25
Method And System For Manufacturing A Surface Using Shaped Charged Particle Beam Lithography
App 20130022929 - Komagata; Takashi ;   et al.
2013-01-24
Method for design and manufacture of diagonal patterns with variable shaped beam lithography
Grant 8,329,365 - Fujimura , et al. December 11, 2
2012-12-11
Method And System For Fracturing A Pattern Using Charged Particle Beam Lithography With Multiple Exposure Passes
App 20120281191 - Zable; Harold Robert ;   et al.
2012-11-08
Method And System For Forming Patterns Using Charged Particle Beam Lithography With Variable Pattern Dosage
App 20120219886 - Fujimura; Akira ;   et al.
2012-08-30
Method And System For Forming Patterns Using Charged Particle Beam Lithography With Overlapping Shots
App 20120217421 - Fujimura; Akira ;   et al.
2012-08-30
Method and system for fracturing a pattern using charged particle beam lithography with multiple exposure passes
Grant 8,221,940 - Zable , et al. July 17, 2
2012-07-17
Method and system for fracturing a pattern using charged particle beam lithography with multiple exposure passes having different dosages
Grant 8,221,939 - Zable , et al. July 17, 2
2012-07-17
Method for Matching of Patterns
App 20120128228 - Fujimura; Akira ;   et al.
2012-05-24
Method and system for fracturing a pattern using charged particle beam lithography with multiple exposure passes which expose different surface area
Grant 8,137,871 - Zable , et al. March 20, 2
2012-03-20
Method For Design And Manufacture Of Diagonal Patterns With Variable Shaped Beam Lithography
App 20120064440 - Fujimura; Akira ;   et al.
2012-03-15
Method for design and manufacture of a reticle using a two-dimensional dosage map and charged particle beam lithography
Grant 8,062,813 - Zable , et al. November 22, 2
2011-11-22
Method for design and manufacture of a reticle using a two-dimensional dosage map and charged particle beam lithography
Grant 8,017,286 - Fujimura , et al. September 13, 2
2011-09-13
Method for fracturing a pattern for writing with a shaped charged particle beam writing system using dragged shots
Grant 7,985,514 - Fujimura , et al. July 26, 2
2011-07-26
Method And System For Fracturing A Pattern Using Charged Particle Beam Lithography With Multiple Exposure Passes
App 20110159436 - Zable; Harold Robert ;   et al.
2011-06-30
Method And System For Fracturing A Pattern Using Charged Particle Beam Lithography With Multiple Exposure Passes Having Different Dosages
App 20110159434 - Zable; Harold Robert ;   et al.
2011-06-30
Method And System For Fracturing A Pattern Using Charged Particle Beam Lithography With Multiple Exposure Passes Which Expose Different Surface Area
App 20110159435 - Zable; Harold Robert ;   et al.
2011-06-30
Method And System For Manufacturing A Surface Using Charged Particle Beam Lithography
App 20110089345 - Komagata; Takashi ;   et al.
2011-04-21
Method for Fracturing a Pattern for Writing with a Shaped Charged Particle Beam Writing System Using Dragged Shots
App 20110089344 - Fujimura; Akira ;   et al.
2011-04-21
Method For Design And Manufacture Of A Reticle Using A Two-dimensional Dosage Map And Charged Particle Beam Lithography
App 20100183963 - Zable; Harold Robert ;   et al.
2010-07-22
Method For Design And Manufacture Of A Reticle Using A Two-dimensional Dosage Map And Charged Particle Beam Lithography
App 20100055587 - Fujimura; Akira ;   et al.
2010-03-04
Cylindrical wrapping using shader hardware
Grant 7,663,621 - Allen , et al. February 16, 2
2010-02-16

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed