Hao,Yue

USPTO Trademark & Patent Filings

Yue Hao

Trademark applications and grants for Hao,yue. Hao,yue has 6 trademark applications. The latest application filed is for "ANYHOLY"

Company Profile
    Company Aliases
  • Hao, Yue
  • Hao,Yue
  • Yue, Hao
  • hao yue
  • HAO; YUE - Xi'an CN
  • Hao; Yue - Beijing CN
  • HAO; Yue - Xi'an CN
  • Hao; Yue - Xi'an CN
  • Yue; Hao - Beijing CN
  • Hao; Yue - Shaanxi CN
Entity Type INDIVIDUAL
Address Anningzhuang West Road, Haidian District No.7,Gate 1,New 6th Floor, No.22,Yard 9 BeiJing CHINA 100080

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks Patents
Patent Applications
Patent ApplicationDate
MATERIAL STRUCTURE FOR LOW THERMAL RESISTANCE SILICON-BASED GALLIUM NITRIDE MICROWAVE AND MILLIMETER-WAVE DEVICES AND MANUFACTURING METHOD THEREOF
20220310796 - 17/282190 ZHANG; JINCHENG ;   et al.
2022-09-29
METHOD FOR OVEREXPRESSING IL-15 IN PORCINE SKELETAL MYOBLASTS AND USE THEREOF
20220227828 - 17/561378 Hao; Yue ;   et al.
2022-07-21
METHODS FOR PREPARING ALN BASED TEMPLATE HAVING SI SUBSTRATE AND GAN BASED EPITAXIAL STRUCTURE HAVING SI SUBSTRATE
20220108885 - 17/275774 LIU; Zhihong ;   et al.
2022-04-07
BIDIRECTIONAL BLOCKING MONOLITHIC HETEROGENEOUS INTEGRATED CASCODE-STRUCTURE FIELD EFFECT TRANSISTOR, AND MANUFACTURING METHOD THEREOF
20220037515 - 17/201234 ZHANG; Chunfu ;   et al.
2022-02-03
HIGH LINEARITY HEMT DEVICE AND PREPARATION METHOD THEREOF
20210359121 - 17/355644 Zheng; Xuefeng ;   et al.
2021-11-18
Experimental platform and experimental method for simulating coal rock disaster of coal mine stope
11,359,999 - 16/666,755 Yang , et al. June 14, 2
2022-06-14
Epitaxial lift-off process of graphene-based gallium nitride
11,133,185 - 16/905,147 Ning , et al. September 28, 2
2021-09-28
Method for growing gallium nitride based on graphene and magnetron sputtered aluminum nitride
11,031,240 - 16/083,255 Zhang , et al. June 8, 2
2021-06-08
Method for characterizing ohmic contact electrode performance of semiconductor device
10,755,990 - 16/377,188 Zheng , et al. A
2020-08-25
Overlay key, method of forming the same, and method of measuring overlay accuracy
10,162,273 - 15/527,910 Zhang , et al. Dec
2018-12-25
Patent Grants & Applications

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