Yu; Sheng-Wen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yu; Sheng-Wen.The latest application filed is for "source/drain junction formation".

Company Profile

3.12.12

Yu; Sheng-Wen - New Taipei TW
Yu; Sheng-Wen - New Taipei City TW
Yu; Sheng-Wen - New Taipie City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Source/drain junction formation Grant 11,387,363 - Tsai , et al. July 12, 2	2022-07-12
Source/Drain Junction Formation App 20200350430 - Tsai; Chun Hsiung ; et al.	2020-11-05
Source/drain junction formation Grant 10,720,529 - Tsai , et al.	2020-07-21
Source/Drain Junction Formation App 20190140089 - Tsai; Chun Hsiung ; et al.	2019-05-09
Source/drain junction formation Grant 10,158,019 - Tsai , et al. Dec	2018-12-18
Cyclic deposition etch chemical vapor deposition epitaxy to reduce EPI abnormality Grant 10,134,896 - Tsai , et al. November 20, 2	2018-11-20
Method of forming a semiconductor device Grant 9,953,878 - Huang , et al. April 24, 2	2018-04-24
Source/Drain Junction Formation App 20170330963 - Tsai; Chun Hsiung ; et al.	2017-11-16
Source/drain junction formation Grant 9,722,083 - Tsai , et al. August 1, 2	2017-08-01
Systems and methods for semiconductor device process determination using reflectivity measurement Grant 9,482,518 - Tsai , et al. November 1, 2	2016-11-01
Method of Forming a Semiconductor Device App 20160155671 - Huang; Yu-Lien ; et al.	2016-06-02
Semiconductor device and method for forming the same Grant 9,257,323 - Huang , et al. February 9, 2	2016-02-09
Systems And Methods For Semiconductor Device Process Determination Using Reflectivity Measurement App 20150292868 - Tsai; Chun Hsiung ; et al.	2015-10-15
Source/Drain Junction Formation App 20150111359 - Tsai; Chun Hsiung ; et al.	2015-04-23
Multi-composition dielectric for semiconductor device Grant 8,927,359 - Liu , et al. January 6, 2	2015-01-06
System for semiconductor device characterization using reflectivity measurement Grant 8,883,522 - Tsai , et al. November 11, 2	2014-11-11
Semiconductor Device and Method for Forming the Same App 20140252432 - Huang; Yu-Lien ; et al.	2014-09-11
Cyclic Deposition Etch Chemical Vapor Deposition Epitaxy To Reduce Epi Abnormality App 20140246710 - TSAI; Chun Hsiung ; et al.	2014-09-04
System For Semiconductor Device Characterization Using Reflectivity Measurement App 20140233043 - Tsai; Chun Hsiung ; et al.	2014-08-21
Multi-composition Dielectric For Semiconductor Device App 20140235044 - Liu; Su-Hao ; et al.	2014-08-21
Method and system for semiconductor device pattern loading effect characterization Grant 8,753,904 - Tsai , et al. June 17, 2	2014-06-17
Method And System For Semiconductor Device Pattern Loading Effect Characterization App 20130330847 - Tsai; Chun Hsiung ; et al.	2013-12-12

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