loadpatents
name:-0.0077800750732422
name:-0.0030810832977295
name:-0.00050902366638184
YU; Sang Yong Patent Filings

YU; Sang Yong

Patent Applications and Registrations

Patent applications and USPTO patent grants for YU; Sang Yong.The latest application filed is for "infrared detector and temperature sensor including the same".

Company Profile
0.3.9
  • YU; Sang Yong - Suwon-si KR
  • Yu; Sang Yong - Hwaseong-si KR
  • Yu; Sang Yong - Gyeonggi-do KR
  • Yu; Sang Yong - Gyunggi-do KR
  • Yu; Sang-Yong - Yongin-si KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Infrared Detector And Temperature Sensor Including The Same
App 20170059414 - LEE; Sung Ho ;   et al.
2017-03-02
Electron beam exposure apparatus and method of detecting error using the same
Grant 9,229,327 - Yu , et al. January 5, 2
2016-01-05
Electron Beam Exposure Apparatus And Method Of Detecting Error Using The Same
App 20150102236 - YU; Sang Yong ;   et al.
2015-04-16
Multi-channel Luminous Energy Sensing Unit, Apparatus For Measuring Light Energy Of Exposure Device And Method For Measuring Light Energy By Channel
App 20140061448 - Yu; Sang Yong ;   et al.
2014-03-06
Calibration Device For Light Measuring Equipment
App 20130050690 - YU; Sang Yong ;   et al.
2013-02-28
Photomasks, methods of exposing a substrate to light, methods of forming a pattern, and methods of manufacturing a semiconductor device
Grant 8,304,173 - Yu , et al. November 6, 2
2012-11-06
Method Of Manufacturing Multilayer Ceramic Capacitor
App 20110247186 - Yu; Sang Yong ;   et al.
2011-10-13
Photomasks, Methods Of Exposing A Substrate To Light, Methods Of Forming A Pattern, And Methods Of Manufacturing A Semiconductor Device
App 20110053096 - Yu; Sang-Yong ;   et al.
2011-03-03
Photomask Cleaning Apparatus And Cleaning Methods Using The Same
App 20080115806 - Yu; Sang-Yong ;   et al.
2008-05-22
System and method for measuring dimension of patterns formed on photomask
Grant 7,369,254 - Lee , et al. May 6, 2
2008-05-06
System and method for measuring dimension of patterns formed on photomask
App 20060066878 - Lee; Dong-Gun ;   et al.
2006-03-30

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