loadpatents
name:-0.037850856781006
name:-0.022032976150513
name:-0.0015799999237061
Yu; Ming Lun Patent Filings

Yu; Ming Lun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yu; Ming Lun.The latest application filed is for "photovoltaic device and methods of forming the same".

Company Profile
1.14.15
  • Yu; Ming Lun - Fremont CA
  • Yu; Ming Lun - Perrysburg OH
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Photovoltaic Device And Methods Of Forming The Same
App 20200066928 - Buller; Benyamin ;   et al.
2020-02-27
Photovoltaic Device And Methods Of Forming The Same
App 20170288073 - Buller; Benyamin ;   et al.
2017-10-05
Method of manufacturing a photovoltaic device
Grant 9,406,829 - Addepalli , et al. August 2, 2
2016-08-02
Method of measuring vapor flux density
Grant 9,383,316 - Beck , et al. July 5, 2
2016-07-05
Photovoltaic Device And Methods Of Forming The Same
App 20150000733 - Buller; Benyamin ;   et al.
2015-01-01
Method Of Manufacturing A Photovoltaic Device
App 20150004743 - Addepalli; Pratima ;   et al.
2015-01-01
Temperature-adjusted spectrometer
Grant 8,734,536 - Beck , et al. May 27, 2
2014-05-27
Flux Monitor
App 20140104616 - BECK; MARKUS E. ;   et al.
2014-04-17
Flux monitor
Grant 8,646,408 - Beck , et al. February 11, 2
2014-02-11
Particle detector
Grant 8,472,021 - Beck , et al. June 25, 2
2013-06-25
Transverse focusing action in hyperbolic field detectors
Grant 8,237,120 - Toth , et al. August 7, 2
2012-08-07
Temperature-adjusted Spectrometer
App 20120018829 - Beck; Markus E. ;   et al.
2012-01-26
Deposition System
App 20120021556 - Beck; Markus E. ;   et al.
2012-01-26
Structural modification using electron beam activated chemical etch
Grant 8,052,885 - Naser-Ghodsi , et al. November 8, 2
2011-11-08
Particle Detector
App 20110249263 - Beck; Markus E. ;   et al.
2011-10-13
Use of ion implantation in chemical etching
Grant 8,008,207 - Yu , et al. August 30, 2
2011-08-30
Flux Monitor
App 20110165315 - Beck; Markus E. ;   et al.
2011-07-07
Pyrometer
App 20110046916 - Yu; Ming Lun ;   et al.
2011-02-24
Etch selectivity enhancement in electron beam activated chemical etch
Grant 7,879,730 - Naser-Ghodsi , et al. February 1, 2
2011-02-01
Method and instrument for chemical defect characterization in high vacuum
Grant 7,635,842 - Nasser-Ghodsi , et al. December 22, 2
2009-12-22
Beam exposure correction system and method
Grant 7,417,233 - Stovall , et al. August 26, 2
2008-08-26
Method And Instrument For Chemical Defect Characterization In High Vacuum
App 20080197277 - Nasser-Ghodsi; Mehran ;   et al.
2008-08-21
Use Of Ion Implantation In Chemical Etching
App 20070264831 - Yu; Ming Lun ;   et al.
2007-11-15
Structural Modification Using Electron Beam Activated Chemical Etch
App 20070158303 - NASSER-GHODSI; MEHRAN ;   et al.
2007-07-12
Etch Selectivity Enhancement In Electron Beam Activated Chemical Etch
App 20070158304 - Nasser-Ghodsi; Mehran ;   et al.
2007-07-12
Beam exposure correction system and method
App 20070069151 - Stovall; Scott C. ;   et al.
2007-03-29

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