loadpatents
Patent applications and USPTO patent grants for Yu; Ming Lun.The latest application filed is for "photovoltaic device and methods of forming the same".
Patent | Date |
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Photovoltaic Device And Methods Of Forming The Same App 20200066928 - Buller; Benyamin ;   et al. | 2020-02-27 |
Photovoltaic Device And Methods Of Forming The Same App 20170288073 - Buller; Benyamin ;   et al. | 2017-10-05 |
Method of manufacturing a photovoltaic device Grant 9,406,829 - Addepalli , et al. August 2, 2 | 2016-08-02 |
Method of measuring vapor flux density Grant 9,383,316 - Beck , et al. July 5, 2 | 2016-07-05 |
Photovoltaic Device And Methods Of Forming The Same App 20150000733 - Buller; Benyamin ;   et al. | 2015-01-01 |
Method Of Manufacturing A Photovoltaic Device App 20150004743 - Addepalli; Pratima ;   et al. | 2015-01-01 |
Temperature-adjusted spectrometer Grant 8,734,536 - Beck , et al. May 27, 2 | 2014-05-27 |
Flux Monitor App 20140104616 - BECK; MARKUS E. ;   et al. | 2014-04-17 |
Flux monitor Grant 8,646,408 - Beck , et al. February 11, 2 | 2014-02-11 |
Particle detector Grant 8,472,021 - Beck , et al. June 25, 2 | 2013-06-25 |
Transverse focusing action in hyperbolic field detectors Grant 8,237,120 - Toth , et al. August 7, 2 | 2012-08-07 |
Temperature-adjusted Spectrometer App 20120018829 - Beck; Markus E. ;   et al. | 2012-01-26 |
Deposition System App 20120021556 - Beck; Markus E. ;   et al. | 2012-01-26 |
Structural modification using electron beam activated chemical etch Grant 8,052,885 - Naser-Ghodsi , et al. November 8, 2 | 2011-11-08 |
Particle Detector App 20110249263 - Beck; Markus E. ;   et al. | 2011-10-13 |
Use of ion implantation in chemical etching Grant 8,008,207 - Yu , et al. August 30, 2 | 2011-08-30 |
Flux Monitor App 20110165315 - Beck; Markus E. ;   et al. | 2011-07-07 |
Pyrometer App 20110046916 - Yu; Ming Lun ;   et al. | 2011-02-24 |
Etch selectivity enhancement in electron beam activated chemical etch Grant 7,879,730 - Naser-Ghodsi , et al. February 1, 2 | 2011-02-01 |
Method and instrument for chemical defect characterization in high vacuum Grant 7,635,842 - Nasser-Ghodsi , et al. December 22, 2 | 2009-12-22 |
Beam exposure correction system and method Grant 7,417,233 - Stovall , et al. August 26, 2 | 2008-08-26 |
Method And Instrument For Chemical Defect Characterization In High Vacuum App 20080197277 - Nasser-Ghodsi; Mehran ;   et al. | 2008-08-21 |
Use Of Ion Implantation In Chemical Etching App 20070264831 - Yu; Ming Lun ;   et al. | 2007-11-15 |
Structural Modification Using Electron Beam Activated Chemical Etch App 20070158303 - NASSER-GHODSI; MEHRAN ;   et al. | 2007-07-12 |
Etch Selectivity Enhancement In Electron Beam Activated Chemical Etch App 20070158304 - Nasser-Ghodsi; Mehran ;   et al. | 2007-07-12 |
Beam exposure correction system and method App 20070069151 - Stovall; Scott C. ;   et al. | 2007-03-29 |
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