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Method For Filling Recessed Features In Semiconductor Devices With A Low-resistivity Metal App 20220301930 - Yu; Kai-Hung ;   et al. | 2022-09-22 |
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Method For Filling Recessed Features In Semiconductor Devices With A Low-resistivity Metal App 20220139776 - Yu; Kai-Hung ;   et al. | 2022-05-05 |
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Selective Deposition Of Conductive Cap For Fully-aligned-via (fav) App 20210242074 - Lu; Yen-Tien ;   et al. | 2021-08-05 |
Method for filling recessed features in semiconductor devices with a low-resistivity metal Grant 11,024,535 - Yu , et al. June 1, 2 | 2021-06-01 |
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Method Of Bottom-up Metallization In A Recessed Feature App 20210082750 - YU; Kai-Hung ;   et al. | 2021-03-18 |
Metal hard mask layers for processing of microelectronic workpieces Grant 10,950,444 - Lu , et al. March 16, 2 | 2021-03-16 |
Interconnect structure and method of forming the same Grant 10,923,392 - Chae , et al. February 16, 2 | 2021-02-16 |
Platform and method of operating for integrated end-to-end fully self-aligned interconnect process Grant 10,923,394 - Clark , et al. February 16, 2 | 2021-02-16 |
Method For Using Ultra Thin Ruthenium Metal Hard Mask For Etching Profile Control App 20210028017 - Lu; Yen-Tien ;   et al. | 2021-01-28 |
Platform and method of operating for integrated end-to-end fully self-aligned interconnect process Grant 10,886,173 - Clark , et al. January 5, 2 | 2021-01-05 |
Platform and method of operating for integrated end-to-end CMP-less interconnect process Grant 10,861,744 - Trickett , et al. December 8, 2 | 2020-12-08 |
Three-dimensional device and method of forming the same Grant 10,770,479 - Smith , et al. Sep | 2020-09-08 |
Ruthenium metal feature fill for interconnects Grant 10,700,009 - Yu , et al. | 2020-06-30 |
Method For Filling Recessed Features In Semiconductor Devices With A Low-resistivity Metal App 20200118871 - Yu; Kai-Hung ;   et al. | 2020-04-16 |
Method of integrated circuit fabrication with dual metal power rail Grant 10,580,691 - Chae , et al. | 2020-03-03 |
Interconnect structure and method of forming the same Grant 10,541,174 - Chae , et al. Ja | 2020-01-21 |
Interconnect Structure And Method Of Forming The Same App 20200006129 - CHAE; Soo Doo ;   et al. | 2020-01-02 |
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Platform And Method Of Operating For Integrated End-to-end Cmp-less Interconnect Process App 20190295887 - Trickett; Ying ;   et al. | 2019-09-26 |
Platform And Method Of Operating For Integrated End-to-end Fully Self-aligned Interconnect Process App 20190295891 - Clark; Robert ;   et al. | 2019-09-26 |
Platform And Method Of Operating For Integrated End-to-end Fully Self-aligned Interconnect Process App 20190295890 - Clark; Robert ;   et al. | 2019-09-26 |
Repeaters with fast transitions from low-power standby to low-frequency signal transmission Grant 10,425,124 - Wang , et al. Sept | 2019-09-24 |
Three-dimensional Device And Method Of Forming The Same App 20190288004 - SMITH; Jeffrey ;   et al. | 2019-09-19 |
Repeaters With Fast Transitions From Low-power Standby To Low-frequency Signal Transmission App 20190288743 - Wang; Jin-sheng ;   et al. | 2019-09-19 |
Method For Protecting Cobalt Plugs App 20190259650 - Han; Sang Cheol ;   et al. | 2019-08-22 |
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Metal Hard Mask Layers For Processing Of Microelectronic Workpieces App 20190237331 - Lu; Yen-Tien ;   et al. | 2019-08-01 |
Removal Method And Processing Method App 20190198390 - ITATANI; Takeshi ;   et al. | 2019-06-27 |
Referenceless clock and data recovery circuits Grant 10,291,241 - Wang , et al. | 2019-05-14 |
Ruthenium Metal Feature Fill For Interconnects App 20190103363 - Yu; Kai-Hung ;   et al. | 2019-04-04 |
Referenceless Clock And Data Recovery Circuits App 20190089361 - Wang; Jin-sheng ;   et al. | 2019-03-21 |
Integration of a self-forming barrier layer and a ruthenium metal liner in copper metallization Grant 10,157,784 - Yu , et al. Dec | 2018-12-18 |
Method Of Integrated Circuit Fabrication With Dual Metal Power Rail App 20180350665 - Chae; Soo Doo ;   et al. | 2018-12-06 |
Ruthenium metal feature fill for interconnects Grant 10,056,328 - Yu , et al. August 21, 2 | 2018-08-21 |
Interconnect Structure And Method Of Forming The Same App 20180211870 - CHAE; Soo Doo ;   et al. | 2018-07-26 |
Referenceless clock and data recovery circuits Grant 10,027,332 - Wang , et al. July 17, 2 | 2018-07-17 |
Selective bottom-up metal feature filling for interconnects Grant 10,014,213 - Yu , et al. July 3, 2 | 2018-07-03 |
Method Of Metal Filling Recessed Features In A Substrate App 20180053688 - Yu; Kai-Hung ;   et al. | 2018-02-22 |
Selective Deposition With Surface Treatment App 20170342553 - Yu; Kai-Hung ;   et al. | 2017-11-30 |
Ruthenium Metal Feature Fill For Interconnects App 20170317022 - Yu; Kai-Hung ;   et al. | 2017-11-02 |
Ruthenium Metal Deposition Method For Electrical Connections App 20170241014 - Yu; Kai-Hung ;   et al. | 2017-08-24 |
Ruthenium metal feature fill for interconnects Grant 9,711,449 - Yu , et al. July 18, 2 | 2017-07-18 |
Metal Filling And Planarization Of Recessed Features App 20170194192 - Yu; Kai-Hung | 2017-07-06 |
Selective Bottom-up Metal Feature Filling For Interconnects App 20170110368 - Yu; Kai-Hung ;   et al. | 2017-04-20 |
Integration of ALD barrier layer and CVD Ru liner for void-free Cu filling Grant 9,607,888 - Yu , et al. March 28, 2 | 2017-03-28 |
Ruthenium Metal Feature Fill For Interconnects App 20160358815 - Yu; Kai-Hung ;   et al. | 2016-12-08 |
Copper wiring forming method, film forming system, and storage medium Grant 9,425,093 - Ishizaka , et al. August 23, 2 | 2016-08-23 |
Copper Wiring Forming Method, Film Forming System, And Storage Medium App 20160163591 - ISHIZAKA; Tadahiro ;   et al. | 2016-06-09 |
INTEGRATION OF ALD BARRIER LAYER AND CVD Ru LINER FOR VOID-FREE Cu FILLING App 20150221550 - Yu; Kai-Hung ;   et al. | 2015-08-06 |