loadpatents
Patent applications and USPTO patent grants for Yu; Chun-Chi.The latest application filed is for "method of foreground auto-calibrating data reception window and related device".
Patent | Date |
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Detection circuit and detection method Grant 11,315,656 - Lin , et al. April 26, 2 | 2022-04-26 |
Method of foreground auto-calibrating data reception window and related device Grant 11,270,745 - Chen , et al. March 8, 2 | 2022-03-08 |
Measurement method of overlay mark structure Grant 11,043,460 - Cheng , et al. June 22, 2 | 2021-06-22 |
Memory system and memory access interface device thereof Grant 10,998,020 - Tsai , et al. May 4, 2 | 2021-05-04 |
Memory system and memory access interface device thereof Grant 10,998,061 - Tsai , et al. May 4, 2 | 2021-05-04 |
DDR SDRAM signal calibration device and method Grant 10,978,118 - Yu , et al. April 13, 2 | 2021-04-13 |
Memory controller and memory data receiving method for generate better sampling clock signal Grant 10,916,278 - Chi , et al. February 9, 2 | 2021-02-09 |
Method of forming gate Grant 10,916,636 - Chen , et al. February 9, 2 | 2021-02-09 |
Method of Foreground Auto-calibrating Data Reception Window and Related Device App 20210027817 - Chen; Shih-Chang ;   et al. | 2021-01-28 |
Measurement Method Of Overlay Mark Structure App 20200388577 - Cheng; Yu-Wei ;   et al. | 2020-12-10 |
Overlay mark structure and measurement method thereof Grant 10,811,362 - Cheng , et al. October 20, 2 | 2020-10-20 |
Method Of Forming Gate App 20200266285 - Chen; Po-Tsang ;   et al. | 2020-08-20 |
Memory access interface device including phase and duty cycle adjusting circuits for memory access signals Grant 10,741,231 - Tsai , et al. A | 2020-08-11 |
Overlay Mark Structure And Measurement Method Thereof App 20200219821 - Cheng; Yu-Wei ;   et al. | 2020-07-09 |
DDR SDRAM physical layer interface circuit and DDR SDRAM control device Grant 10,698,846 - Chi , et al. | 2020-06-30 |
Control Circuit, Sampling Circuit For Synchronous Dynamic Random-access Memory, Method Of Reading Procedure And Calibration Ther App 20200143868 - YU; Chun-Chi ;   et al. | 2020-05-07 |
DDR SDRAM physical layer interface circuit and DDR SDRAM control device App 20200142844 - CHI; KUO-WEI ;   et al. | 2020-05-07 |
Control circuit, sampling circuit for synchronous dynamic random-access memory, method of reading procedure and calibration thereof Grant 10,643,685 - Yu , et al. | 2020-05-05 |
On-die-termination circuit and control method for of the same Grant 10,630,289 - Huang , et al. | 2020-04-21 |
Memory signal phase difference calibration circuit and method Grant 10,522,204 - Yu , et al. Dec | 2019-12-31 |
Memory device and test method of the same Grant 10,269,443 - Yu , et al. | 2019-04-23 |
Memory control device for repeating data during a preamble signal or a postamble signal and memory control method Grant 10,056,124 - Yu , et al. August 21, 2 | 2018-08-21 |
Memory Device And Test Method Of The Same App 20180233211 - YU; Chun-Chi ;   et al. | 2018-08-16 |
Memory Control Device And Memory Control Method App 20180166109 - Yu; Chun-Chi ;   et al. | 2018-06-14 |
Overlay target for optically measuring overlay alignment of layers formed on semiconductor wafer Grant 9,653,404 - Wang , et al. May 16, 2 | 2017-05-16 |
Memory system and memory physical layer interface circuit Grant 9,570,130 - Yu , et al. February 14, 2 | 2017-02-14 |
Asymmetry compensation method used in lithography overlay process Grant 9,494,873 - Liou , et al. November 15, 2 | 2016-11-15 |
Memory System And Memory Physical Layer Interface Circuit App 20160329085 - YU; Chun-Chi ;   et al. | 2016-11-10 |
Overlap mark set and method for selecting recipe of measuring overlap error Grant 9,482,964 - Liou , et al. November 1, 2 | 2016-11-01 |
Photo-mask and method of manufacturing semiconductor structures by using the same Grant 9,448,471 - Liou , et al. September 20, 2 | 2016-09-20 |
Method of correcting overlay error Grant 9,400,435 - Liou , et al. July 26, 2 | 2016-07-26 |
Memory control circuit for adjusting reference voltage and associated memory control method Grant 9,355,708 - Yu , et al. May 31, 2 | 2016-05-31 |
Double Patterning Method App 20160103396 - Liou; En-Chiuan ;   et al. | 2016-04-14 |
Memory Control Circuit And Associated Memory Control Method App 20160035411 - Yu; Chun-Chi ;   et al. | 2016-02-04 |
Photo-mask And Method Of Manufacturing Semiconductor Structures By Using The Same App 20160018728 - Liou; En-Chiuan ;   et al. | 2016-01-21 |
Asymmetry Compensation Method Used In Lithography Overlay Process App 20160018741 - LIOU; EN-CHIUAN ;   et al. | 2016-01-21 |
Method Of Correcting Overlay Error App 20150362905 - Liou; En-Chiuan ;   et al. | 2015-12-17 |
Overlap Mark Set And Method For Selecting Recipe Of Measuring Overlap Error App 20150293461 - Liou; En-Chiuan ;   et al. | 2015-10-15 |
Measurement Mark Structure App 20150276382 - Liou; En-Chiuan ;   et al. | 2015-10-01 |
Method of forming via hole Grant 9,147,601 - Wu , et al. September 29, 2 | 2015-09-29 |
Memory control circuit and method of controlling data reading process of memory module Grant 9,135,980 - Yu , et al. September 15, 2 | 2015-09-15 |
Patterning method Grant 9,136,140 - Huang , et al. September 15, 2 | 2015-09-15 |
Measurement method of overlay mark Grant 9,007,571 - Tzai , et al. April 14, 2 | 2015-04-14 |
Method Of Forming Via Hole App 20150072529 - Wu; Cheng-Han ;   et al. | 2015-03-12 |
Patterning Method App 20150072532 - Huang; Wen-Liang ;   et al. | 2015-03-12 |
Measurement Method Of Overlay Mark App 20150055125 - Tzai; Wei-Jhe ;   et al. | 2015-02-26 |
Memory Control Circuit And Method Of Controlling Data Reading Process Of Memory Module App 20150049562 - Yu; Chun-Chi ;   et al. | 2015-02-19 |
Method of forming via hole Grant 8,916,051 - Wu , et al. December 23, 2 | 2014-12-23 |
Alignment accuracy mark Grant 8,729,716 - Chuang , et al. May 20, 2 | 2014-05-20 |
Method of forming a photoresist pattern App 20140120476 - Yu; Tuan-Yen ;   et al. | 2014-05-01 |
Overlay mark for multiple pre-layers and currently layer Grant 8,564,143 - Chen , et al. October 22, 2 | 2013-10-22 |
Overlay Mark For Multiple Pre-layers And Currently Layer App 20130200535 - Chen; Yi-Ting ;   et al. | 2013-08-08 |
Method for forming photoresist patterns Grant 8,476,004 - Huang , et al. July 2, 2 | 2013-07-02 |
Alignment Accuracy Mark App 20130106000 - Chuang; Kai-Lin ;   et al. | 2013-05-02 |
Method For Forming Photoresist Patterns App 20120329280 - Huang; Yong-Fa ;   et al. | 2012-12-27 |
Method of Forming Via Hole App 20120164835 - Wu; Cheng-Han ;   et al. | 2012-06-28 |
Method and related operation system for immersion lithography Grant 7,633,601 - Huang , et al. December 15, 2 | 2009-12-15 |
Method for designing photomask Grant 7,476,472 - Shieh , et al. January 13, 2 | 2009-01-13 |
Method Of Moving Bubbles App 20080067335 - Hou; Ya-Ching ;   et al. | 2008-03-20 |
Method And Related Operation System For Immersion Lithography App 20070215040 - Huang; Yong-Fa ;   et al. | 2007-09-20 |
Method For Designing Photomask App 20070020532 - Shieh; Ming-Feng ;   et al. | 2007-01-25 |
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