loadpatents
name:-0.031661987304688
name:-0.041105985641479
name:-0.018299102783203
Yu; Chun-Chi Patent Filings

Yu; Chun-Chi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yu; Chun-Chi.The latest application filed is for "method of foreground auto-calibrating data reception window and related device".

Company Profile
17.37.30
  • Yu; Chun-Chi - Hsinchu TW
  • Yu; Chun-Chi - Hsinchu County TW
  • Yu; Chun-Chi - Taipei TW
  • Yu; Chun-Chi - Taipei City TW
  • Yu; Chun-Chi - Zhubei TW
  • YU; Chun-Chi - Zhubei City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Detection circuit and detection method
Grant 11,315,656 - Lin , et al. April 26, 2
2022-04-26
Method of foreground auto-calibrating data reception window and related device
Grant 11,270,745 - Chen , et al. March 8, 2
2022-03-08
Measurement method of overlay mark structure
Grant 11,043,460 - Cheng , et al. June 22, 2
2021-06-22
Memory system and memory access interface device thereof
Grant 10,998,020 - Tsai , et al. May 4, 2
2021-05-04
Memory system and memory access interface device thereof
Grant 10,998,061 - Tsai , et al. May 4, 2
2021-05-04
DDR SDRAM signal calibration device and method
Grant 10,978,118 - Yu , et al. April 13, 2
2021-04-13
Memory controller and memory data receiving method for generate better sampling clock signal
Grant 10,916,278 - Chi , et al. February 9, 2
2021-02-09
Method of forming gate
Grant 10,916,636 - Chen , et al. February 9, 2
2021-02-09
Method of Foreground Auto-calibrating Data Reception Window and Related Device
App 20210027817 - Chen; Shih-Chang ;   et al.
2021-01-28
Measurement Method Of Overlay Mark Structure
App 20200388577 - Cheng; Yu-Wei ;   et al.
2020-12-10
Overlay mark structure and measurement method thereof
Grant 10,811,362 - Cheng , et al. October 20, 2
2020-10-20
Method Of Forming Gate
App 20200266285 - Chen; Po-Tsang ;   et al.
2020-08-20
Memory access interface device including phase and duty cycle adjusting circuits for memory access signals
Grant 10,741,231 - Tsai , et al. A
2020-08-11
Overlay Mark Structure And Measurement Method Thereof
App 20200219821 - Cheng; Yu-Wei ;   et al.
2020-07-09
DDR SDRAM physical layer interface circuit and DDR SDRAM control device
Grant 10,698,846 - Chi , et al.
2020-06-30
Control Circuit, Sampling Circuit For Synchronous Dynamic Random-access Memory, Method Of Reading Procedure And Calibration Ther
App 20200143868 - YU; Chun-Chi ;   et al.
2020-05-07
DDR SDRAM physical layer interface circuit and DDR SDRAM control device
App 20200142844 - CHI; KUO-WEI ;   et al.
2020-05-07
Control circuit, sampling circuit for synchronous dynamic random-access memory, method of reading procedure and calibration thereof
Grant 10,643,685 - Yu , et al.
2020-05-05
On-die-termination circuit and control method for of the same
Grant 10,630,289 - Huang , et al.
2020-04-21
Memory signal phase difference calibration circuit and method
Grant 10,522,204 - Yu , et al. Dec
2019-12-31
Memory device and test method of the same
Grant 10,269,443 - Yu , et al.
2019-04-23
Memory control device for repeating data during a preamble signal or a postamble signal and memory control method
Grant 10,056,124 - Yu , et al. August 21, 2
2018-08-21
Memory Device And Test Method Of The Same
App 20180233211 - YU; Chun-Chi ;   et al.
2018-08-16
Memory Control Device And Memory Control Method
App 20180166109 - Yu; Chun-Chi ;   et al.
2018-06-14
Overlay target for optically measuring overlay alignment of layers formed on semiconductor wafer
Grant 9,653,404 - Wang , et al. May 16, 2
2017-05-16
Memory system and memory physical layer interface circuit
Grant 9,570,130 - Yu , et al. February 14, 2
2017-02-14
Asymmetry compensation method used in lithography overlay process
Grant 9,494,873 - Liou , et al. November 15, 2
2016-11-15
Memory System And Memory Physical Layer Interface Circuit
App 20160329085 - YU; Chun-Chi ;   et al.
2016-11-10
Overlap mark set and method for selecting recipe of measuring overlap error
Grant 9,482,964 - Liou , et al. November 1, 2
2016-11-01
Photo-mask and method of manufacturing semiconductor structures by using the same
Grant 9,448,471 - Liou , et al. September 20, 2
2016-09-20
Method of correcting overlay error
Grant 9,400,435 - Liou , et al. July 26, 2
2016-07-26
Memory control circuit for adjusting reference voltage and associated memory control method
Grant 9,355,708 - Yu , et al. May 31, 2
2016-05-31
Double Patterning Method
App 20160103396 - Liou; En-Chiuan ;   et al.
2016-04-14
Memory Control Circuit And Associated Memory Control Method
App 20160035411 - Yu; Chun-Chi ;   et al.
2016-02-04
Photo-mask And Method Of Manufacturing Semiconductor Structures By Using The Same
App 20160018728 - Liou; En-Chiuan ;   et al.
2016-01-21
Asymmetry Compensation Method Used In Lithography Overlay Process
App 20160018741 - LIOU; EN-CHIUAN ;   et al.
2016-01-21
Method Of Correcting Overlay Error
App 20150362905 - Liou; En-Chiuan ;   et al.
2015-12-17
Overlap Mark Set And Method For Selecting Recipe Of Measuring Overlap Error
App 20150293461 - Liou; En-Chiuan ;   et al.
2015-10-15
Measurement Mark Structure
App 20150276382 - Liou; En-Chiuan ;   et al.
2015-10-01
Method of forming via hole
Grant 9,147,601 - Wu , et al. September 29, 2
2015-09-29
Memory control circuit and method of controlling data reading process of memory module
Grant 9,135,980 - Yu , et al. September 15, 2
2015-09-15
Patterning method
Grant 9,136,140 - Huang , et al. September 15, 2
2015-09-15
Measurement method of overlay mark
Grant 9,007,571 - Tzai , et al. April 14, 2
2015-04-14
Method Of Forming Via Hole
App 20150072529 - Wu; Cheng-Han ;   et al.
2015-03-12
Patterning Method
App 20150072532 - Huang; Wen-Liang ;   et al.
2015-03-12
Measurement Method Of Overlay Mark
App 20150055125 - Tzai; Wei-Jhe ;   et al.
2015-02-26
Memory Control Circuit And Method Of Controlling Data Reading Process Of Memory Module
App 20150049562 - Yu; Chun-Chi ;   et al.
2015-02-19
Method of forming via hole
Grant 8,916,051 - Wu , et al. December 23, 2
2014-12-23
Alignment accuracy mark
Grant 8,729,716 - Chuang , et al. May 20, 2
2014-05-20
Method of forming a photoresist pattern
App 20140120476 - Yu; Tuan-Yen ;   et al.
2014-05-01
Overlay mark for multiple pre-layers and currently layer
Grant 8,564,143 - Chen , et al. October 22, 2
2013-10-22
Overlay Mark For Multiple Pre-layers And Currently Layer
App 20130200535 - Chen; Yi-Ting ;   et al.
2013-08-08
Method for forming photoresist patterns
Grant 8,476,004 - Huang , et al. July 2, 2
2013-07-02
Alignment Accuracy Mark
App 20130106000 - Chuang; Kai-Lin ;   et al.
2013-05-02
Method For Forming Photoresist Patterns
App 20120329280 - Huang; Yong-Fa ;   et al.
2012-12-27
Method of Forming Via Hole
App 20120164835 - Wu; Cheng-Han ;   et al.
2012-06-28
Method and related operation system for immersion lithography
Grant 7,633,601 - Huang , et al. December 15, 2
2009-12-15
Method for designing photomask
Grant 7,476,472 - Shieh , et al. January 13, 2
2009-01-13
Method Of Moving Bubbles
App 20080067335 - Hou; Ya-Ching ;   et al.
2008-03-20
Method And Related Operation System For Immersion Lithography
App 20070215040 - Huang; Yong-Fa ;   et al.
2007-09-20
Method For Designing Photomask
App 20070020532 - Shieh; Ming-Feng ;   et al.
2007-01-25

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