Youkai; Toshikazu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Youkai; Toshikazu.The latest application filed is for "line quality characteristic evaluation system".
- Youkai; Toshikazu - Tokyo JP
| Patent | Date |
|---|---|
| Line quality characteristic evaluation system Grant 7,177,599 - Nakazawa , et al. February 13, 2 | 2007-02-13 |
| Interference measurement and evaluation system Grant 7,107,011 - Nakazawa , et al. September 12, 2 | 2006-09-12 |
| Line quality characteristic evaluation system App 20040179484 - Nakazawa, Isao ; et al. | 2004-09-16 |
| Interference measurement and evaluation system App 20040171351 - Nakazawa, Isao ; et al. | 2004-09-02 |
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