Yotsuya; Teruhisa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yotsuya; Teruhisa.The latest application filed is for "image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data".

Company Profile

0.10.7

Yotsuya; Teruhisa - Kyoto JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods of and apparatus for inspecting substrate Grant 7,869,644 - Murakami , et al. January 11, 2	2011-01-11
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data Grant 7,680,320 - Murakami , et al. March 16, 2	2010-03-16
Substrate inspection method and apparatus Grant 7,512,260 - Murakami , et al. March 31, 2	2009-03-31
Apparatus for surface inspection and method and apparatus for inspecting substrate Grant 7,505,149 - Ishiba , et al. March 17, 2	2009-03-17
Method of generating image and illumination device for inspecting substrate Grant 7,394,084 - Kuriyama , et al. July 1, 2	2008-07-01
Inspection method and system for and method of producing component mounting substrate Grant 7,310,406 - Kuriyama , et al. December 18, 2	2007-12-18
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data App 20060140471 - Murakami; Kiyoshi ; et al.	2006-06-29
Substrate inspection method and apparatus App 20060050267 - Murakami; Kiyoshi ; et al.	2006-03-09
Methods of and apparatus for inspecting substrate App 20060018531 - Murakami; Kiyoshi ; et al.	2006-01-26
Method of generating image and illumination device for inspecting substrate App 20060000989 - Kuriyama; Jun ; et al.	2006-01-05
Inspection method and system for and method of producing component mounting substrate App 20060002510 - Kuriyama; Jun ; et al.	2006-01-05
Inspection method and system and production method of mounted substrate App 20050209822 - Ishiba, Masato ; et al.	2005-09-22
Apparatus for surface inspection and method and apparatus for inspecting substrate App 20050190361 - Ishiba, Masato ; et al.	2005-09-01
Apparatus for inspecting printed circuit boards and the like, and method of operating same Grant 5,245,671 - Kobayashi , et al. September 14, 1	1993-09-14
Apparatus for inspecting packaged electronic device Grant 5,027,295 - Yotsuya June 25, 1	1991-06-25
Apparatus for inspecting packaged electronic device Grant 4,953,100 - Yotsuya August 28, 1	1990-08-28
Input method for reference printed circuit board assembly data to an image processing printed circuit board assembly automatic inspection apparatus Grant 4,894,790 - Yotsuya , et al. January 16, 1	1990-01-16

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