loadpatents
name:-0.008613109588623
name:-0.016386985778809
name:-0.0004270076751709
Yoshioka; Haruhiko Patent Filings

Yoshioka; Haruhiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yoshioka; Haruhiko.The latest application filed is for "probe apparatus".

Company Profile
0.13.6
  • Yoshioka; Haruhiko - Nirasaki JP
  • Yoshioka, Haruhiko - Nirasaki-shi JP
  • Yoshioka; Haruhiko - Higashiyamanashi-gun JP
  • Yoshioka, Haruhiko - Yamanashi-Ken JP
  • Yoshioka; Haruhiko - Yamanishi-ken JP
  • Yoshioka; Haruhiko - Yamanashi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Vacuum prober and vacuum probe method
Grant 7,221,176 - Yoshioka , et al. May 22, 2
2007-05-22
Stage driving apparatus and probe method
Grant 7,106,082 - Yoshioka September 12, 2
2006-09-12
Probe apparatus
App 20050253611 - Yoshioka, Haruhiko
2005-11-17
Vacuum prober and vacuum probe method
App 20050206396 - Yoshioka, Haruhiko ;   et al.
2005-09-22
Prober
Grant 6,933,736 - Kobayashi , et al. August 23, 2
2005-08-23
Probe apparatus
Grant 6,927,587 - Yoshioka August 9, 2
2005-08-09
Stage driving apparatus and probe method
App 20050127898 - Yoshioka, Haruhiko
2005-06-16
Probing method
Grant 6,850,052 - Iino , et al. February 1, 2
2005-02-01
Prober
App 20040164759 - Kobayashi, Masahito ;   et al.
2004-08-26
Probe apparatus
App 20040036861 - Yoshioka, Haruhiko
2004-02-26
Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism
Grant 6,634,245 - Yoshioka , et al. October 21, 2
2003-10-21
Probing method
App 20030025495 - Ilno, Shinji ;   et al.
2003-02-06
Prober and probe method
Grant 6,140,828 - Iino , et al. October 31, 2
2000-10-31
Probe apparatus
Grant 5,912,555 - Akaike , et al. June 15, 1
1999-06-15
Probe apparatus with tilt correction mechanisms
Grant 5,804,983 - Nakajima , et al. September 8, 1
1998-09-08
Probe apparatus for correcting the probe card posture before testing
Grant 5,642,056 - Nakajima , et al. June 24, 1
1997-06-24
Probe system and probe method
Grant 5,640,101 - Kuji , et al. June 17, 1
1997-06-17
Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment
Grant 5,585,738 - Kuji , et al. December 17, 1
1996-12-17
Method of ashing layers, and apparatus for ashing layers
Grant 4,812,201 - Sakai , et al. March 14, 1
1989-03-14

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed