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Patent applications and USPTO patent grants for Yoshioka; Haruhiko.The latest application filed is for "probe apparatus".
Patent | Date |
---|---|
Vacuum prober and vacuum probe method Grant 7,221,176 - Yoshioka , et al. May 22, 2 | 2007-05-22 |
Stage driving apparatus and probe method Grant 7,106,082 - Yoshioka September 12, 2 | 2006-09-12 |
Probe apparatus App 20050253611 - Yoshioka, Haruhiko | 2005-11-17 |
Vacuum prober and vacuum probe method App 20050206396 - Yoshioka, Haruhiko ;   et al. | 2005-09-22 |
Prober Grant 6,933,736 - Kobayashi , et al. August 23, 2 | 2005-08-23 |
Probe apparatus Grant 6,927,587 - Yoshioka August 9, 2 | 2005-08-09 |
Stage driving apparatus and probe method App 20050127898 - Yoshioka, Haruhiko | 2005-06-16 |
Probing method Grant 6,850,052 - Iino , et al. February 1, 2 | 2005-02-01 |
Prober App 20040164759 - Kobayashi, Masahito ;   et al. | 2004-08-26 |
Probe apparatus App 20040036861 - Yoshioka, Haruhiko | 2004-02-26 |
Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism Grant 6,634,245 - Yoshioka , et al. October 21, 2 | 2003-10-21 |
Probing method App 20030025495 - Ilno, Shinji ;   et al. | 2003-02-06 |
Prober and probe method Grant 6,140,828 - Iino , et al. October 31, 2 | 2000-10-31 |
Probe apparatus Grant 5,912,555 - Akaike , et al. June 15, 1 | 1999-06-15 |
Probe apparatus with tilt correction mechanisms Grant 5,804,983 - Nakajima , et al. September 8, 1 | 1998-09-08 |
Probe apparatus for correcting the probe card posture before testing Grant 5,642,056 - Nakajima , et al. June 24, 1 | 1997-06-24 |
Probe system and probe method Grant 5,640,101 - Kuji , et al. June 17, 1 | 1997-06-17 |
Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment Grant 5,585,738 - Kuji , et al. December 17, 1 | 1996-12-17 |
Method of ashing layers, and apparatus for ashing layers Grant 4,812,201 - Sakai , et al. March 14, 1 | 1989-03-14 |
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