loadpatents
name:-0.014714002609253
name:-0.0092270374298096
name:-0.0028350353240967
YOSHINO; Kiminori Patent Filings

YOSHINO; Kiminori

Patent Applications and Registrations

Patent applications and USPTO patent grants for YOSHINO; Kiminori.The latest application filed is for "modeling method".

Company Profile
2.7.12
  • YOSHINO; Kiminori - Kuwana Mie JP
  • Yoshino; Kiminori - Kuwana JP
  • YOSHINO; Kiminori - Yokkaichi JP
  • Yoshino; Kiminori - Yokkaichi-Shi JP
  • YOSHINO; Kiminori - Yokohama-Shi JP
  • Yoshino; Kiminori - Toyota JP
  • Yoshino; Kiminori - Nishikamo-gun JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Modeling Method
App 20220302102 - MIURA; Shimpei ;   et al.
2022-09-22
Semiconductor defect inspection apparatus and semiconductor defect inspection method
Grant 11,119,059 - Yoshino September 14, 2
2021-09-14
Imprinting system, method of manufacturing semiconductor device, and recording medium
Grant 10,915,018 - Nishimura , et al. February 9, 2
2021-02-09
Semiconductor defect inspection apparatus
Grant 10,890,539 - Shirakawa , et al. January 12, 2
2021-01-12
Semiconductor Defect Inspection Apparatus
App 20200408700 - SHIRAKAWA; Hiroaki ;   et al.
2020-12-31
Measurement apparatus for measuring height or shape of a surface of a material
Grant 10,845,190 - Yoshino November 24, 2
2020-11-24
Semiconductor Defect Inspection Apparatus And Semiconductor Defect Inspection Method
App 20200271600 - YOSHINO; Kiminori
2020-08-27
Measurement Apparatus
App 20190271541 - YOSHINO; Kiminori
2019-09-05
Imprinting System, Method Of Manufacturing Semiconductor Device, And Recording Medium
App 20190243236 - NISHIMURA; Takahito ;   et al.
2019-08-08
Inspection Apparatus And Inspection Method
App 20160363541 - YOSHINO; Kiminori
2016-12-15
Pattern inspection method and pattern inspection apparatus
Grant 9,176,074 - Fujii , et al. November 3, 2
2015-11-03
Pattern Inspection Method And Pattern Inspection Apparatus
App 20140212023 - FUJII; Takayoshi ;   et al.
2014-07-31
Pattern Inspection Apparatus And Method
App 20130063721 - FUJII; Takayoshi ;   et al.
2013-03-14
Pattern Inspection Device And Method
App 20100171947 - YOSHINO; Kiminori
2010-07-08
Shock absorbing steering apparatus
Grant 7,455,320 - Imamura , et al. November 25, 2
2008-11-25
Shock absorbing steering apparatus
App 20060181070 - Imamura; Kenji ;   et al.
2006-08-17
Support mechanism of steering system
Grant 6,764,098 - Matsumoto , et al. July 20, 2
2004-07-20
Support mechanism of steering system
App 20020167157 - Matsumoto, Shin ;   et al.
2002-11-14

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