YOSHIMORI; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for YOSHIMORI; Takashi.The latest application filed is for "stent graft".

Company Profile

2.10.8

YOSHIMORI; Takashi - Kanagawa JP
Yoshimori; Takashi - Bungo-ono JP
YOSHIMORI; Takashi - Oita JP
Yoshimori; Takashi - Izumisano JP
Yoshimori; Takashi - Bungo-ono-shi JP
YOSHIMORI; Takashi - Izumisano-shi Osaka
Yoshimori; Takashi - Osaka JP
Yoshimori; Takashi - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Stent Graft App 20220241064 - YOSHIMORI; Takashi ; et al.	2022-08-04
Filler material, filler delivery device, and filler delivery method Grant 11,317,922 - Yamanouchi , et al. May 3, 2	2022-05-03
Stent Graft App 20220039939 - SHIRAHAMA; Noriaki ; et al.	2022-02-10
Core member, gapped core, current sensor, and method for manufacturing gapped core Grant 10,802,055 - Nagano , et al. October 13, 2	2020-10-13
Filter Device App 20200306026 - YAMANOUCHI; Dai ; et al.	2020-10-01
Electric current detector and core component used therefor Grant 10,578,652 - Yoshimori , et al.	2020-03-03
Filler Material, Filler Delivery Device, And Filler Delivery Method App 20190298390 - YAMANOUCHI; Dai ; et al.	2019-10-03
Core Member, Gapped Core, Current Sensor, And Method For Manufacturing Gapped Core App 20190033346 - NAGANO; Ai ; et al.	2019-01-31
Electric Current Detector And Core Component Used Therefor App 20180356447 - Yoshimori; Hitoshi ; et al.	2018-12-13
Electric current detector and core component used therefor Grant 10,088,504 - Yoshimori , et al. October 2, 2	2018-10-02
Electric Current Detector And Core Component Used Therefor App 20150204913 - Yoshimori; Hitoshi ; et al.	2015-07-23
Electric current detector and core component used therefor Grant 9,035,643 - Yoshimori , et al. May 19, 2	2015-05-19
Electric Current Detector And Core Component Used Therefor App 20120299589 - Yoshimori; Hitoshi ; et al.	2012-11-29
Semiconductor integrated circuit for selectively performing a rewiring or a logical operation Grant 5,444,393 - Yoshimori , et al. August 22, 1	1995-08-22
Multifunctional scan flip-flop Grant 5,175,447 - Kawasaki , et al. December 29, 1	1992-12-29
Testing integrated circuit capable of easily performing parametric test on high pin count semiconductor device Grant 5,115,191 - Yoshimori May 19, 1	1992-05-19
CMOS type input buffer circuit for semiconductor device and semiconductor device with the same Grant 5,101,119 - Yoshimori , et al. March 31, 1	1992-03-31

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