Yoshiki; Masahiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yoshiki; Masahiko.The latest application filed is for "semiconductor device and method for manufacturing the same".

Company Profile

0.8.10

Yoshiki; Masahiko - Yokohama JP
Yoshiki; Masahiko - Yokohama-Shi JP
Yoshiki; Masahiko - Kanagawa-ken JP
Yoshiki; Masahiko - Kanagawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device and method for manufacturing the same Grant 8,169,040 - Tsuchiya , et al. May 1, 2	2012-05-01
Semiconductor device and method for manufacturing the same Grant 8,129,792 - Ichihara , et al. March 6, 2	2012-03-06
Semiconductor Device And Method For Manufacturing The Same App 20100258880 - TSUCHIYA; Yoshinori ; et al.	2010-10-14
Semiconductor device and method for manufacturing the same Grant 7,768,077 - Tsuchiya , et al. August 3, 2	2010-08-03
Semiconductor device and method for manufacturing the same Grant 7,737,503 - Tsuchiya , et al. June 15, 2	2010-06-15
Semiconductor Device And Method For Manufacturing The Same App 20100078731 - TSUCHIYA; Yoshinori ; et al.	2010-04-01
Semiconductor Device And Method For Manufacturing The Same App 20090166749 - ICHIHARA; Reika ; et al.	2009-07-02
Semiconductor device, and method for manufacturing the same App 20090032884 - Tsuchiya; Yoshinori ; et al.	2009-02-05
Semiconductor device, and method for manufacturing the same Grant 7,416,967 - Tsuchiya , et al. August 26, 2	2008-08-26
Method and device for measuring quantity of wear Grant 7,375,327 - Yoshiki , et al. May 20, 2	2008-05-20
Apparatus, method, and computer program product for deconvolution analysis Grant 7,358,492 - Tomita , et al. April 15, 2	2008-04-15
Semiconductor Device And Method For Manufacturing The Same App 20080029822 - TSUCHIYA; Yoshinori ; et al.	2008-02-07
Semiconductor device, and method for manufacturing the same App 20070210351 - Tsuchiya; Yoshinori ; et al.	2007-09-13
Semiconductor device App 20070057335 - Tsuchiya; Yoshinori ; et al.	2007-03-15
Apparatus, method, and computer program product for deconvolution analysis App 20060278823 - Tomita; Mitsuhiro ; et al.	2006-12-14
Method and device for measuring quantity of wear App 20060108545 - Yoshiki; Masahiko ; et al.	2006-05-25
Method and device for measuring quantity of wear App 20040011957 - Yoshiki, Masahiko ; et al.	2004-01-22
Semiconductor device comprises an impurity layer having boron ions in the form of clusters of icosahedron structure Grant 5,598,025 - Murakoshi , et al. January 28, 1	1997-01-28

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