Yoshikawa; Shinya
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yoshikawa; Shinya.The latest application filed is for "defect classification apparatus".
- Yoshikawa; Shinya - Fukushima JP
- Yoshikawa; Shinya - Iwaki JP
- Yoshikawa; Shinya - Tokyo JP
- Yoshikawa; Shinya - Chiyoda-ku JP
- Yoshikawa, Shinya - Ako-gun JP
| Patent | Date |
|---|---|
| Electronic apparatus and electronic system Grant 9,467,543 - Yoshikawa October 11, 2 | 2016-10-11 |
| Screen display control system and screen display control method Grant 9,395,948 - Yoshikawa July 19, 2 | 2016-07-19 |
| Defect classification apparatus Grant 8,977,580 - Anayama , et al. March 10, 2 | 2015-03-10 |
| Electronic apparatus Grant 8,583,088 - Yoshikawa , et al. November 12, 2 | 2013-11-12 |
| Defect Classification Apparatus App 20130173508 - Anayama; Kazunori ; et al. | 2013-07-04 |
| Screen Display Control System And Screen Display Control Method App 20130141309 - Yoshikawa; Shinya | 2013-06-06 |
| Electronic Apparatus And Electronic System App 20130093958 - Yoshikawa; Shinya | 2013-04-18 |
| Electronic Apparatus App 20120157065 - Yoshikawa; Shinya ; et al. | 2012-06-21 |
| Method of scavenging intermediate formed by reaction of oxidoreductase with substrate App 20050282241 - Ogura, Takashi ; et al. | 2005-12-22 |
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