YOSHIKAWA; Ryoji

Patent Applications and Registrations

Patent applications and USPTO patent grants for YOSHIKAWA; Ryoji.The latest application filed is for "inspection method and inspection apparatus".

Company Profile

1.9.14

YOSHIKAWA; Ryoji - Yokohama Kanagawa JP
Yoshikawa; Ryoji - Kanagawa JP
Yoshikawa; Ryoji - Yokohama JP
Yoshikawa; Ryoji - Kanagawa-ken JP
YOSHIKAWA; Ryoji - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection Method And Inspection Apparatus App 20220230289 - CHIBA; Keisuke ; et al.	2022-07-21
Electron Beam Device And Image Acquisition Method App 20220084782 - YOSHIKAWA; Ryoji	2022-03-17
Original Plate Manufacturing Method, Drawing Data Creation Method, And Pattern Defect Repairing Method App 20220035243 - YOSHIKAWA; Ryoji ; et al.	2022-02-03
Defect inspection device and defect inspection method Grant 10,976,656 - Yoshikawa April 13, 2	2021-04-13
Defect Inspection Device And Defect Inspection Method App 20190285980 - YOSHIKAWA; Ryoji	2019-09-19
Pattern inspection apparatus and pattern inspection method Grant 9,894,271 - Yoshikawa , et al. February 13, 2	2018-02-13
Pattern Inspection Apparatus And Pattern Inspection Method App 20160275365 - Yoshikawa; Ryoji ; et al.	2016-09-22
Pattern forming method and mask pattern data Grant 9,244,343 - Yoshikawa , et al. January 26, 2	2016-01-26
Pattern Forming Method And Mask Pattern Data App 20150021295 - YOSHIKAWA; Ryoji ; et al.	2015-01-22
Template Inspection Device App 20140314305 - YOSHIKAWA; Ryoji	2014-10-23
Lithography Original Checking Device, Lithography Original Checking Method, And Pattern Data Creating Method App 20140232032 - Yoshikawa; Ryoji ; et al.	2014-08-21
Photomask inspection method, semiconductor device inspection method, and pattern inspection apparatus Grant 8,811,713 - Yoshikawa August 19, 2	2014-08-19
Pattern inspection device and method of inspecting pattern Grant 8,358,340 - Yoshikawa , et al. January 22, 2	2013-01-22
Pattern Inspection Method And Semiconductor Device Manufacturing Method App 20110237087 - YOSHIKAWA; Ryoji	2011-09-29
Mask defect inspection data generating method, mask defect inspection method and mask production method Grant 7,742,162 - Tsutsui , et al. June 22, 2	2010-06-22
Photomask Inspection Method, Semiconductor Device Inspection Method, And Pattern Inspection Apparatus App 20100054577 - YOSHIKAWA; Ryoji	2010-03-04
Pattern Inspection Device And Method Of Inspecting Pattern App 20090303323 - Yoshikawa; Ryoji ; et al.	2009-12-10
Reference data generating method, pattern defect checking apparatus, pattern defect checking method, reference data generating program, and semiconductor device manufacturing method Grant 7,602,961 - Yoshikawa , et al. October 13, 2	2009-10-13
Mask Defect Inspection Data Generating Method, Mask Defect Inspection Method And Mask Production Method App 20090046280 - TSUTSUI; Tomohiro ; et al.	2009-02-19
Apparatus And Method For Inspecting A Pattern And Method For Manufacturing A Semiconductor Device App 20080055606 - Inoue; Hiromu ; et al.	2008-03-06
Reference data generating method, pattern defect checking apparatus, pattern defect checking method, reference data generating program, and semiconductor device manufacturing method App 20050169513 - Yoshikawa, Ryoji ; et al.	2005-08-04

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