Yoshikawa; Akihiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yoshikawa; Akihiko.The latest application filed is for "photoelectric conversion device and characteristic inspection method for same".

Company Profile

0.15.16

Yoshikawa; Akihiko - Chiba N/A JP
Yoshikawa; Akihiko - Tokyo N/A JP
Yoshikawa; Akihiko - Chiba-shi JP
Yoshikawa; Akihiko - Hachioji JP
Yoshikawa, Akihiko - Chiba City JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Photoelectric conversion device Grant 9,530,920 - Yoshikawa , et al. December 27, 2	2016-12-27
Photoelectric conversion device and characteristic inspection method for same Grant 9,509,124 - Yoshikawa , et al. November 29, 2	2016-11-29
Photoelectric conversion device Grant 9,444,000 - Yoshikawa , et al. September 13, 2	2016-09-13
Microscope system, storage medium storing control program, and control method Grant 8,699,129 - Shirota , et al. April 15, 2	2014-04-15
Photoelectric Conversion Device And Characteristic Inspection Method For Same App 20130208267 - Yoshikawa; Akihiko ; et al.	2013-08-15
Photoelectric Conversion Device App 20130174894 - Yoshikawa; Akihiko ; et al.	2013-07-11
Photoelectric Conversion Device And Characteristic Inspection Method For Same App 20130016345 - Yoshikawa; Akihiko ; et al.	2013-01-17
Predetermined site luminescence measuring method, predetermined site luminescence measuring apparatus, expression amount measuring method, and measuring apparatus Grant 8,280,142 - Suzuki , et al. October 2, 2	2012-10-02
Method of producing zinc oxide semiconductor crystal Grant 8,268,075 - Omichi , et al. September 18, 2	2012-09-18
Photoelectric Conversion Device App 20120186640 - Yoshikawa; Akihiko ; et al.	2012-07-26
Microscope and lamphouse Grant 8,194,313 - Yoshikawa , et al. June 5, 2	2012-06-05
Predetermined Site Luminescence Measuring Method, Predetermined Site Luminescence Measuring Apparatus, Expression Amount Measuring Method, And Measuring Apparatus App 20110249137 - SUZUKI; Hirobumi ; et al.	2011-10-13
Predetermined site luminescence measuring method, predetermined site luminescence measuring apparatus, expression amount measuring method, and measuring apparatus Grant 7,986,824 - Suzuki , et al. July 26, 2	2011-07-26
Microscope And Lamphouse App 20110170181 - Yoshikawa; Akihiko ; et al.	2011-07-14
Microscope System, Storage Medium Storing Control Program, And Control Method App 20110164314 - Shirota; Tetsuya ; et al.	2011-07-07
Microscope apparatus control method and microscope apparatus Grant 7,945,108 - Kono , et al. May 17, 2	2011-05-17
Optical apparatus provided with correction collar for aberration correction and imaging method using same Grant 7,825,360 - Karasawa , et al. November 2, 2	2010-11-02
Predetermined Site Luminescence Measuring Method, Predetermined Site Luminescence Measuring Apparatus, Expression Amount Measuring Method, and Measuring Apparatus App 20090274360 - Suzuki; Hirobumi ; et al.	2009-11-05
Method Of Producing Zinc Oxide Semiconductor Crystal App 20090260563 - Omichi; Koji ; et al.	2009-10-22
Optical apparatus and imaging method App 20080310016 - Karasawa; Masayoshi ; et al.	2008-12-18
Microscope apparatus control method and microscope apparatus App 20080055718 - Kono; Takayuki ; et al.	2008-03-06
Microscope and lamphouse App 20070091939 - Yoshikawa; Akihiko ; et al.	2007-04-26
Semiconductor device having a nitride-based hetero-structure and method of manufacturing the same Grant 6,856,005 - Yoshikawa , et al. February 15, 2	2005-02-15
Semiconductor device having a nitride-based hetero-structure and method of manufacturing the same App 20040108500 - Yoshikawa, Akihiko ; et al.	2004-06-10

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