Yorisaki; Shingo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yorisaki; Shingo.The latest application filed is for "fabrication method of semiconductor integrated circuit device".

Company Profile

0.9.11

Yorisaki; Shingo - Tokyo N/A JP
Yorisaki; Shingo - Hachioji JP
Yorisaki; Shingo - Tachikawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Manufacturing method of semiconductor integrated circuit device Grant 8,357,933 - Hasebe , et al. January 22, 2	2013-01-22
Fabrication Method Of Semiconductor Integrated Circuit Device App 20110175634 - Okamoto; Masayoshi ; et al.	2011-07-21
Fabrication Method Of Semiconductor Integrated Circuit Device App 20110136272 - OKAMOTO; Masayoshi ; et al.	2011-06-09
Fabrication method of semiconductor integrated circuit device Grant 7,901,958 - Okamoto , et al. March 8, 2	2011-03-08
Fabrication Method Of Semiconductor Integrated Circuit Device App 20100304510 - OKAMOTO; Masayoshi ; et al.	2010-12-02
Manufactoring Method Of Semiconductor Integrated Circuit Device App 20100277192 - HASEBE; Akio ; et al.	2010-11-04
Manufacturing method of semiconductor integrated circuit device Grant 7,776,626 - Hasebe , et al. August 17, 2	2010-08-17
Manufacturing method of semiconductor integrated circuit device Grant 7,598,100 - Matsumoto , et al. October 6, 2	2009-10-06
Manufacturing Method Of Semiconductor Integrated Circuit Device App 20090130785 - Matsumoto; Hideyuki ; et al.	2009-05-21
Manufacturing method of semiconductor integrated circuit device and probe card Grant 7,517,707 - Okamoto , et al. April 14, 2	2009-04-14
Manufacturing Method Of Semiconductor Integrated Circuit Device App 20090017565 - Hasebe; Akio ; et al.	2009-01-15
Manufacturing method of semiconductor integrated circuit device Grant 7,407,823 - Hasebe , et al. August 5, 2	2008-08-05
Fabrication Method Of Semiconductor Integrated Circuit Device App 20080020498 - OKAMOTO; Masayoshi ; et al.	2008-01-24
Manufacturing method of semiconductor integrated circuit device and probe card Grant 7,271,015 - Okamoto , et al. September 18, 2	2007-09-18
Manufacturing method of semiconductor integrated circuit device and probe card App 20070190671 - Okamoto; Masayoshi ; et al.	2007-08-16
Manufacturing method of semiconductor integrated circuit device App 20060286715 - Hasebe; Akio ; et al.	2006-12-21
Manufacturing method of semiconductor integrated circuit device and probe card App 20050227383 - Okamoto, Masayoshi ; et al.	2005-10-13
Fabrication method of semiconductor integrated circuit device App 20050093565 - Okamoto, Masayoshi ; et al.	2005-05-05
Method for manufacturing a semiconductor device including wafer aging, probe inspection, and feeding back the results of the inspection to the device fabrication process Grant 5,219,765 - Yoshida , et al. June 15, 1	1993-06-15

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