Yoon; Young-Jee

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yoon; Young-Jee.The latest application filed is for "apparatus for forming a thin layer and method of forming a thin layer on a substrate usnig the same".

Company Profile

0.5.8

Yoon; Young-Jee - Yongin-si KR
Yoon; Young-Jee - Gyeonggi-do KR
Yoon; Young-Jee - Anyang-si KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus for forming a thin layer and method of forming a thin layer on a substrate using the same Grant 9,892,983 - Kim , et al. February 13, 2	2018-02-13
Apparatus For Forming A Thin Layer And Method Of Forming A Thin Layer On A Substrate Usnig The Same App 20160181167 - KIM; Min-Kook ; et al.	2016-06-23
Method and apparatus for inspecting a substrate Grant 7,747,063 - Lim , et al. June 29, 2	2010-06-29
Apparatus and method for inspecting a surface of a wafer Grant 7,697,130 - Ko , et al. April 13, 2	2010-04-13
Method of scanning a substrate, and method and apparatus for analyzing crystal characteristics Grant 7,626,164 - Yoon , et al. December 1, 2	2009-12-01
Apparatus And Method For Inspecting A Surface Of A Wafer App 20090219520 - Ko; Woo-Seok ; et al.	2009-09-03
Methods of compensating for an alignment error during fabrication of structures on semiconductor substrates Grant 7,498,248 - Lim , et al. March 3, 2	2009-03-03
Methods of compensating for an alignment error during fabrication of structures on semiconductor substrates App 20070120220 - Lim; Jung-Taek ; et al.	2007-05-31
Method Of Scanning A Substrate, And Method And Apparatus For Analyzing Crystal Characteristics App 20070120054 - YOON; Young-Jee ; et al.	2007-05-31
Method Of Inspecting A Defect On A Substrate App 20070030479 - PARK; Sung-Hong ; et al.	2007-02-08
Method And Apparatus For Inspecting A Substrate App 20070031025 - Lim; Jung-Taek ; et al.	2007-02-08
Apparatus and method for measuring substrates App 20050191768 - Yoon, Young-Jee ; et al.	2005-09-01
Electron-beam inspection apparatus and methods of inspecting through-holes using clustered nanotube arrays App 20050151456 - Yoon, Young-Jee ; et al.	2005-07-14

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