Yoon; Kwang Jun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yoon; Kwang Jun.The latest application filed is for "composition for alleviating skin inflammation caused by yellow dust and fine particulate, comprising natural plant extract".

Company Profile

1.4.8

Yoon; Kwang Jun - Incheon KR
Yoon; Kwang-jun - Suwon-si KR
Yoon; Kwang-Jun - Yongin KR
Yoon; Kwang-Jun - Kyungki-do KR
Yoon, Kwang-Jun - Yongin-city KR
Yoon, Kwang-Jun - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Whitening cosmetic composition comprising Caragana sinica root extract Grant 11,202,751 - Park , et al. December 21, 2	2021-12-21
Composition For Alleviating Skin Inflammation Caused By Yellow Dust And Fine Particulate, Comprising Natural Plant Extract App 20200390842 - Kim; Jae Hun ; et al.	2020-12-17
Composition For Alleviating Skin Inflammation Caused By Yellow Dust And Fine Particulate, Comprising Natural Plant Extract App 20180207222 - Kim; Jae Hun ; et al.	2018-07-26
Whitening Cosmetic Composition Comprising Caragana Sinica Root Extract App 20180185269 - PARK; Sung Min ; et al.	2018-07-05
Apparatus for focus control and method for manufacturing semiconductor device Grant 9,903,705 - Kim , et al. February 27, 2	2018-02-27
Apparatus For Focus Control And Method For Manufacturing Semiconductor Device App 20170108329 - KIM; KWANG-SOO ; et al.	2017-04-20
Method and apparatus for inspecting an edge exposure area of a wafer Grant 7,280,233 - Shin , et al. October 9, 2	2007-10-09
Systems and methods for measuring distance of semiconductor patterns Grant 7,274,471 - Shin , et al. September 25, 2	2007-09-25
Systems and methods for measuring distance of semiconductor patterns App 20050134867 - Shin, Koung-Su ; et al.	2005-06-23
Method and apparatus for inspecting an edge exposure area of a wafer App 20040169869 - Shin, Koung-Su ; et al.	2004-09-02
Method Of Reconstructing A Tomogram Of An X-ray Apparatus App 20030007595 - Kim, Hyeong-Cheol ; et al.	2003-01-09
Battery Inspection System App 20020166802 - Jung, Jae-Hyun ; et al.	2002-11-14

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