loadpatents
name:-0.011703968048096
name:-0.0076849460601807
name:-0.0066161155700684
Yoon; Byung Kuk Patent Filings

Yoon; Byung Kuk

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yoon; Byung Kuk.The latest application filed is for "memory device".

Company Profile
5.7.9
  • Yoon; Byung Kuk - Gyeonggi-do KR
  • YOON; Byung Kuk - Icheon-si Gyeonggi-do KR
  • Yoon; Byung Kuk - Hwaseong-si KR
  • Yoon; Byung Kuk - Suwon-si KR
  • YOON; Byung Kuk - Suwon-si Gyeonggi-do KR
  • YOON; Byung Kuk - Hwaseong-si Gyeonggi-do KR
  • Yoon; Byung Kuk - Icheon-si KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Delay circuit and phase interpolator
Grant 11,349,466 - Park , et al. May 31, 2
2022-05-31
Memory Device
App 20220115083 - PARK; Ji Hwan ;   et al.
2022-04-14
Clock Generator Circuit And Integrated Circuit Including The Same
App 20220078003 - PARK; Ji Hwan ;   et al.
2022-03-10
Delay Circuit And Phase Interpolator
App 20210320651 - PARK; Ji Hwan ;   et al.
2021-10-14
Semiconductor device
Grant 10,762,933 - Kim , et al. Sep
2020-09-01
Semiconductor devices
Grant 10,535,382 - Yoon , et al. Ja
2020-01-14
Semiconductor Devices
App 20190341086 - YOON; Byung Kuk ;   et al.
2019-11-07
Semiconductor Device
App 20190325925 - KIM; Hong Gyeom ;   et al.
2019-10-24
Semiconductor devices
Grant 10,403,334 - Yoon , et al. Sep
2019-09-03
Semiconductor Devices
App 20180336937 - YOON; Byung Kuk ;   et al.
2018-11-22
Integrated Circuits
App 20180218776 - KIM; Chang Hyun ;   et al.
2018-08-02
Integrated circuits compensating for timing skew difference between signals
Grant 10,037,811 - Kim , et al. July 31, 2
2018-07-31
Test circuit and test method of semiconductor apparatus
Grant 9,450,587 - Ku , et al. September 20, 2
2016-09-20
Semiconductor Chip And Stack Type Semiconductor Apparatus Using The Same
App 20160163619 - LEE; Jae Seung ;   et al.
2016-06-09
Repair system for semiconductor apparatus and repair method using the same
Grant 9,287,010 - You , et al. March 15, 2
2016-03-15
Test Circuit And Test Method Of Semiconductor Apparatus
App 20160043726 - KU; Kie Bong ;   et al.
2016-02-11

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