loadpatents
Patent applications and USPTO patent grants for Yoon; Byung Kuk.The latest application filed is for "memory device".
Patent | Date |
---|---|
Delay circuit and phase interpolator Grant 11,349,466 - Park , et al. May 31, 2 | 2022-05-31 |
Memory Device App 20220115083 - PARK; Ji Hwan ;   et al. | 2022-04-14 |
Clock Generator Circuit And Integrated Circuit Including The Same App 20220078003 - PARK; Ji Hwan ;   et al. | 2022-03-10 |
Delay Circuit And Phase Interpolator App 20210320651 - PARK; Ji Hwan ;   et al. | 2021-10-14 |
Semiconductor device Grant 10,762,933 - Kim , et al. Sep | 2020-09-01 |
Semiconductor devices Grant 10,535,382 - Yoon , et al. Ja | 2020-01-14 |
Semiconductor Devices App 20190341086 - YOON; Byung Kuk ;   et al. | 2019-11-07 |
Semiconductor Device App 20190325925 - KIM; Hong Gyeom ;   et al. | 2019-10-24 |
Semiconductor devices Grant 10,403,334 - Yoon , et al. Sep | 2019-09-03 |
Semiconductor Devices App 20180336937 - YOON; Byung Kuk ;   et al. | 2018-11-22 |
Integrated Circuits App 20180218776 - KIM; Chang Hyun ;   et al. | 2018-08-02 |
Integrated circuits compensating for timing skew difference between signals Grant 10,037,811 - Kim , et al. July 31, 2 | 2018-07-31 |
Test circuit and test method of semiconductor apparatus Grant 9,450,587 - Ku , et al. September 20, 2 | 2016-09-20 |
Semiconductor Chip And Stack Type Semiconductor Apparatus Using The Same App 20160163619 - LEE; Jae Seung ;   et al. | 2016-06-09 |
Repair system for semiconductor apparatus and repair method using the same Grant 9,287,010 - You , et al. March 15, 2 | 2016-03-15 |
Test Circuit And Test Method Of Semiconductor Apparatus App 20160043726 - KU; Kie Bong ;   et al. | 2016-02-11 |
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