Yonezawa; Toshihiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yonezawa; Toshihiro.The latest application filed is for "probe device".
- Yonezawa; Toshihiro - Nirasaki N/A JP
- Yonezawa; Toshihiro - Yamanashi JP
- Yonezawa; Toshihiro - Nirasaki-shi JP
- Yonezawa; Toshihiro - Yamanashi-ken JP
- Yonezawa; Toshihiro - Kitakoma-Gun JP
| Patent | Date |
|---|---|
| Cantilevered probe having a bending contact Grant 8,674,717 - Yonezawa March 18, 2 | 2014-03-18 |
| Probe card having a structure for being prevented from deforming Grant 8,415,964 - Yonezawa , et al. April 9, 2 | 2013-04-09 |
| Probe device having a structure for being prevented from deforming Grant 8,319,511 - Yonezawa , et al. November 27, 2 | 2012-11-27 |
| Mechanism for fixing probe card Grant RE42,655 - Yonezawa August 30, 2 | 2011-08-30 |
| Mechanism for fixing probe card Grant RE42,115 - Yonezawa February 8, 2 | 2011-02-08 |
| Probe device and method of regulating contact pressure between object to be inspected and probe Grant 7,847,569 - Yonezawa , et al. December 7, 2 | 2010-12-07 |
| Probe Card App 20100301887 - Yonezawa; Toshihiro ; et al. | 2010-12-02 |
| Probe Device App 20100301888 - Yonezawa; Toshihiro ; et al. | 2010-12-02 |
| Probe App 20100277193 - Yonezawa; Toshihiro | 2010-11-04 |
| Probe and method of manufacturing probe Grant 7,649,369 - Okumura , et al. January 19, 2 | 2010-01-19 |
| Probe Device And Method Of Regulating Contact Pressure Between Object To Be Inspected And Probe App 20090284272 - Yonezawa; Toshihiro ; et al. | 2009-11-19 |
| Probe Card App 20080048698 - Amemiya; Takashi ; et al. | 2008-02-28 |
| Probe and Method of Manufacturing Probe App 20080036479 - Okumura; Katsuya ; et al. | 2008-02-14 |
| Mechanism for fixing probe card Grant 6,831,455 - Yonezawa December 14, 2 | 2004-12-14 |
| Mechanism for fixing probe card App 20040090223 - Yonezawa, Toshihiro | 2004-05-13 |
| Temperature control apparatus App 20020014894 - Yonezawa, Toshihiro ; et al. | 2002-02-07 |
| Semiconductor wafer holder with spring-mounted temperature measurement apparatus disposed therein Grant 6,084,215 - Furuya , et al. July 4, 2 | 2000-07-04 |
| Apparatus for aligning a semiconductor wafer with an inspection contactor Grant 5,999,268 - Yonezawa , et al. December 7, 1 | 1999-12-07 |
| Inspection apparatus, transportation apparatus, and temperature control apparatus Grant 5,708,222 - Yonezawa , et al. January 13, 1 | 1998-01-13 |
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