Yonezawa; Tomikazu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yonezawa; Tomikazu.The latest application filed is for "x-ray inspection system".
- Yonezawa; Tomikazu - Hamamatsu JP
- Yonezawa, Tomikazu - Hamamatsu-shi JP
| Patent | Date |
|---|---|
| X-ray inspection system Grant 7,356,117 - Suzuki , et al. April 8, 2 | 2008-04-08 |
| X-ray inspection system App 20050100130 - Suzuki, Makoto ; et al. | 2005-05-12 |
| X-ray inspection system Grant 6,876,722 - Suzuki , et al. April 5, 2 | 2005-04-05 |
| X-ray inspection system App 20030142784 - Suzuki, Makoto ; et al. | 2003-07-31 |
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