Yonezawa; Eiji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yonezawa; Eiji.The latest application filed is for "living tissue stimulation circuit".
- Yonezawa; Eiji - Okazaki JP
- YONEZAWA; Eiji - Okazaki-shi JP
- Yonezawa; Eiji - Aichi JP
| Patent | Date |
|---|---|
| Living tissue stimulation circuit Grant 8,504,167 - Yonezawa , et al. August 6, 2 | 2013-08-06 |
| Sight regeneration assisting device Grant 8,249,716 - Tano , et al. August 21, 2 | 2012-08-21 |
| Vision regeneration assisting apparatus Grant 8,244,362 - Yonezawa August 14, 2 | 2012-08-14 |
| Living Tissue Stimulation Circuit App 20120116483 - YONEZAWA; Eiji ; et al. | 2012-05-10 |
| Vision regeneration assisting device Grant 7,974,699 - Tano , et al. July 5, 2 | 2011-07-05 |
| Sight Regeneration Assisting Device App 20100222842 - Tano; Yasuo ; et al. | 2010-09-02 |
| Electrical stimulation method for vision improvement App 20080183242 - Tano; Yasuo ; et al. | 2008-07-31 |
| Defect inspection apparatus Grant 7,333,650 - Yamamoto , et al. February 19, 2 | 2008-02-19 |
| Vision regeneration assisting device App 20070225775 - Tano; Yasuo ; et al. | 2007-09-27 |
| Load modulation communication circuit and visual restoration aiding device provided with the same App 20070185573 - Yonezawa; Eiji | 2007-08-09 |
| Vision regeneration assisting apparatus App 20060287688 - Yonezawa; Eiji | 2006-12-21 |
| Inspection apparatus for inspecting resist removal width Grant 7,009,196 - Yonezawa , et al. March 7, 2 | 2006-03-07 |
| Defect inspection method and defect inspection apparatus Grant 6,928,185 - Yonezawa August 9, 2 | 2005-08-09 |
| Defect inspection apparatus App 20050002560 - Yamamoto, Takayasu ; et al. | 2005-01-06 |
| Visual inspection apparatus Grant 6,801,651 - Yonezawa October 5, 2 | 2004-10-05 |
| Pattern inspection apparatus Grant 6,735,333 - Yonezawa May 11, 2 | 2004-05-11 |
| Inspection apparatus for inspecting resist removal width App 20030222231 - Yonezawa, Eiji ; et al. | 2003-12-04 |
| Defect inspecting apparatus Grant 6,621,568 - Yonezawa September 16, 2 | 2003-09-16 |
| Defect inspection method and defect inspection apparatus App 20020001405 - Yonezawa, Eiji | 2002-01-03 |
| Defect inspection method and defect inspection apparatus App 20010048522 - Yonezawa, Eiji | 2001-12-06 |
| Visual inspection apparatus App 20010012393 - Yonezawa, Eiji | 2001-08-09 |
| Defect inspecting apparatus and method Grant 6,222,624 - Yonezawa April 24, 2 | 2001-04-24 |
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