Yokosuka; Toshiyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yokosuka; Toshiyuki.The latest application filed is for "charged particle beam device".
Company Profile
18.34.34
- Yokosuka; Toshiyuki - Tokyo JP
- Yokosuka; Toshiyuki - Hitachinaka N/A JP
- Yokosuka; Toshiyuki - Hitachi JP
Patent Activity
| Patent | Date |
|---|---|
| Charged-particle beam device and cross-sectional shape estimation program Grant 11,443,914 - Yokosuka , et al. September 13, 2 | 2022-09-13 |
| Charged Particle Beam Device App 20220122804 - YOKOSUKA; Toshiyuki ; et al. | 2022-04-21 |
| Charged particle beam device Grant 11,239,052 - Yokosuka , et al. February 1, 2 | 2022-02-01 |
| Pattern cross-sectional shape estimation system and program Grant 11,211,226 - Yokosuka , et al. December 28, 2 | 2021-12-28 |
| Charged-Particle Beam Device and Cross-Sectional Shape Estimation Program App 20210366685 - YOKOSUKA; Toshiyuki ; et al. | 2021-11-25 |
| Scanning electron microscope and calculation method for three-dimensional structure depth Grant 11,164,720 - Yasui , et al. November 2, 2 | 2021-11-02 |
| Charged particle ray device and cross-sectional shape estimation program Grant 11,133,147 - Yokosuka , et al. September 28, 2 | 2021-09-28 |
| Charged particle ray device and cross-sectional shape estimation program Grant 11,101,100 - Yokosuka , et al. August 24, 2 | 2021-08-24 |
| Scanning electron microscope and sample observation method using scanning electron microscope Grant 11,011,348 - Bizen , et al. May 18, 2 | 2021-05-18 |
| Pattern Cross-sectional Shape Estimation System And Program App 20200321189 - YOKOSUKA; Toshiyuki ; et al. | 2020-10-08 |
| Charged Particle Beam Device App 20200312615 - YOKOSUKA; Toshiyuki ; et al. | 2020-10-01 |
| Charged Particle Ray Device And Cross-sectional Shape Estimation Program App 20200294756 - YOKOSUKA; Toshiyuki ; et al. | 2020-09-17 |
| Charged particle beam device and capturing condition adjusting method in charged particle beam device Grant 10,770,266 - Nakano , et al. Sep | 2020-09-08 |
| Scanning Electron Microscope And Calculation Method For Three-dimensional Structure Depth App 20200234916 - YASUI; Kenji ; et al. | 2020-07-23 |
| Charged particle beam device Grant 10,720,306 - Yokosuka , et al. | 2020-07-21 |
| Charged particle beam apparatus and method for adjusting imaging conditions for the same Grant 10,566,172 - Nakano , et al. Feb | 2020-02-18 |
| Charged Particle Beam Device and Capturing Condition Adjusting Method in Charged Particle Beam Device App 20200035449 - NAKANO; Tomohito ; et al. | 2020-01-30 |
| Charged particle beam device Grant 10,541,103 - Mizuhara , et al. Ja | 2020-01-21 |
| Scanning Electron Microscope And Sample Observation Method Using Scanning Electron Microscope App 20190348255 - BIZEN; Daisuke ; et al. | 2019-11-14 |
| Charged particle beam device Grant 10,446,359 - Yokosuka , et al. Oc | 2019-10-15 |
| Charged Particle Beam Device App 20190180979 - YOKOSUKA; Toshiyuki ; et al. | 2019-06-13 |
| Charged Particle Beam Apparatus and Method for Adjusting Imaging Conditions for the Same App 20190172676 - NAKANO; Tomohito ; et al. | 2019-06-06 |
| Charged particle beam device and pattern measurement device Grant 10,290,464 - Yokosuka , et al. | 2019-05-14 |
| Charged Particle Beam Device App 20190103250 - YOKOSUKA; Toshiyuki ; et al. | 2019-04-04 |
| Charged particle beam device Grant 10,249,474 - Yokosuka , et al. | 2019-04-02 |
| Charged Particle Beam Device and Pattern Measurement Device App 20180182595 - YOKOSUKA; Toshiyuki ; et al. | 2018-06-28 |
| Charged Particle Beam Device App 20180012725 - YOKOSUKA; Toshiyuki ; et al. | 2018-01-11 |
| Charged Particle Beam Device App 20170345613 - MIZUHARA; Yuzuru ; et al. | 2017-11-30 |
| Charged particle beam device Grant 9,786,468 - Yokosuka , et al. October 10, 2 | 2017-10-10 |
| Charged Particle Beam Device App 20170278671 - YOKOSUKA; Toshiyuki ; et al. | 2017-09-28 |
| Charged particle beam device Grant 9,697,987 - Yokosuka , et al. July 4, 2 | 2017-07-04 |
| Electron beam irradiation method and scanning electron microscope Grant 9,640,366 - Yokosuka , et al. May 2, 2 | 2017-05-02 |
| Scanning electron microscope Grant 9,472,376 - Yokosuka , et al. October 18, 2 | 2016-10-18 |
| Charged Particle Beam Device App 20160240348 - YOKOSUKA; Toshiyuki ; et al. | 2016-08-18 |
| Electron beam irradiation method and scanning electronic microscope Grant 9,257,259 - Kobayashi , et al. February 9, 2 | 2016-02-09 |
| Charged Particle Beam Device App 20150357154 - YOKOSUKA; Toshiyuki ; et al. | 2015-12-10 |
| Scanning Electron Microscope App 20150008322 - Yokosuka; Toshiyuki ; et al. | 2015-01-08 |
| Electron microscope and image capturing method using electron beam Grant 8,907,279 - Tsuno , et al. December 9, 2 | 2014-12-09 |
| Electron Microscope And Image Capturing Method Using Electron Beam App 20140097342 - Tsuno; Natsuki ; et al. | 2014-04-10 |
| Charged particle accelerator Grant 8,659,243 - Morita , et al. February 25, 2 | 2014-02-25 |
| Electron Beam Irradiation Method And Scanning Electronic Microscope App 20130187045 - Kobayashi; Kinya ; et al. | 2013-07-25 |
| Electron Beam Irradiation Method and Scanning Electron Microscope App 20130009057 - Yokosuka; Toshiyuki ; et al. | 2013-01-10 |
| Charged Particle Accelerator App 20120025741 - MORITA; Hiroshi ; et al. | 2012-02-02 |
| Charged particle accelerator Grant 8,067,907 - Morita , et al. November 29, 2 | 2011-11-29 |
| Mass spectrometer system Grant 7,932,486 - Sano , et al. April 26, 2 | 2011-04-26 |
| Electron Beam Generator App 20090295269 - MORITA; Hiroshi ; et al. | 2009-12-03 |
| Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program Grant 7,595,484 - Yokosuka , et al. September 29, 2 | 2009-09-29 |
| Charged Particle Accelerator App 20090224701 - MORITA; Hiroshi ; et al. | 2009-09-10 |
| Mass Spectrometer System App 20090189063 - Sano; Akihiro ; et al. | 2009-07-30 |
| Tandem type mass analysis system and method Grant 7,544,930 - Yoshinari , et al. June 9, 2 | 2009-06-09 |
| Mass spectrometer system Grant 7,473,892 - Sano , et al. January 6, 2 | 2009-01-06 |
| Mass spectrometric analysis method and system using the method Grant 7,435,949 - Ohtake , et al. October 14, 2 | 2008-10-14 |
| Mass spectrometric method and mass spectrometric system Grant 7,332,713 - Yoshinari , et al. February 19, 2 | 2008-02-19 |
| Mass analysis system App 20070221836 - Kobayashi; Kinya ; et al. | 2007-09-27 |
| Tandem Type Mass Analysis System And Method App 20070187588 - Yoshinari; Kiyomi ; et al. | 2007-08-16 |
| Mass spectrometry and mass spectrometry system Grant 7,180,056 - Ohtake , et al. February 20, 2 | 2007-02-20 |
| Mass spectrometric analysis method and system using the method App 20060289735 - Ohtake; Atsushi ; et al. | 2006-12-28 |
| Mass spectrometry system Grant 7,126,113 - Yokosuka , et al. October 24, 2 | 2006-10-24 |
| Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program App 20060169889 - Yokosuka; Toshiyuki ; et al. | 2006-08-03 |
| Mass spectrometric method and mass spectrometric system App 20060043281 - Yoshinari; Kiyomi ; et al. | 2006-03-02 |
| Mass spectrometry and mass spectrometry system App 20050274884 - Otake, Atsushi ; et al. | 2005-12-15 |
| Mass spectrometry system App 20050184232 - Yokosuka, Toshiyuki ; et al. | 2005-08-25 |
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