YOHANAN; Raviv

Patent Applications and Registrations

Patent applications and USPTO patent grants for YOHANAN; Raviv.The latest application filed is for "optical metrology utilizing short-wave infrared wavelengths".

Company Profile

4.8.10

YOHANAN; Raviv - Qiryat Motzkin IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical Metrology Utilizing Short-wave Infrared Wavelengths App 20220291143 - Manassen; Amnon ; et al.	2022-09-15
Device-like overlay metrology targets displaying Moire effects Grant 11,355,375 - Volkovich , et al. June 7, 2	2022-06-07
Data-driven misregistration parameter configuration and measurement system and method Grant 11,353,493 - Katz , et al. June 7, 2	2022-06-07
Device-like Overlay Metrology Targets Displaying Moire Effects App 20220020625 - Volkovich; Roie ; et al.	2022-01-20
Misregistration Target Having Device-Scaled Features Useful in Measuring Misregistration of Semiconductor Devices App 20220013468 - Volkovich; Roie ; et al.	2022-01-13
System for combined imaging and scatterometry metrology Grant 11,067,904 - Amit , et al. July 20, 2	2021-07-20
Data-driven Misregistration Parameter Configuration And Measurement System And Method App 20210011073 - Katz; Shlomit ; et al.	2021-01-14
Compound imaging metrology targets Grant 10,527,951 - Yohanan , et al. J	2020-01-07
Identifying registration errors of DSA lines Grant 10,401,841 - Volkovich , et al. Sep	2019-09-03
Combined Imaging And Scatterometry Metrology App 20190250521 - Amit; Eran ; et al.	2019-08-15
Method and apparatus for direct self assembly in target design and production Grant 10,303,835 - Amit , et al.	2019-05-28
Metrology target for combined imaging and scatterometry metrology Grant 10,274,837 - Amit , et al.	2019-04-30
Metrology targets with filling elements that reduce inaccuracies and maintain contrast Grant 10,002,806 - Amir , et al. June 19, 2	2018-06-19
Compound Imaging Metrology Targets App 20160179017 - YOHANAN; Raviv ; et al.	2016-06-23
Identifying Registration Errors Of Dsa Lines App 20160018819 - VOLKOVICH; Roie ; et al.	2016-01-21
Method And Apparatus For Direct Self Assembly In Target Design And Production App 20150242558 - AMIT; Eran ; et al.	2015-08-27
Metrology Targets With Filling Elements That Reduce Inaccuracies And Maintain Contrast App 20150227675 - Amir; Nuriel ; et al.	2015-08-13
Combined Imaging And Scatterometry Metrology App 20150177135 - AMIT; Eran ; et al.	2015-06-25

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