Yoda; Haruo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yoda; Haruo.The latest application filed is for "subject information acquisition apparatus".

Company Profile

1.70.59

Yoda; Haruo - Nishitama-gun JP
Yoda; Haruo - Tokyo N/A JP
YODA; Haruo - Hinode JP
Yoda; Haruo - Nishitama JP
Yoda; Haruo - Hinode-machi JP
Yoda; Haruo - Hinodemachi JP
Yoda, Haruo - Hinoda JP
Yoda; Haruo - Kodaira JP
Yoda; Haruo - Hachioji JA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Object information acquiring apparatus, information processing apparatus and object information acquiring method Grant 10,426,352 - Yoda October 1, 2	2019-10-01
Subject Information Acquisition Apparatus App 20190069874 - Yoda; Haruo	2019-03-07
Object information acquiring apparatus and method of controlling same Grant 9,924,876 - Yoda March 27, 2	2018-03-27
Object information acquiring apparatus Grant 9,664,782 - Yoda May 30, 2	2017-05-30
Signal processing circuit and ultrasonic diagnostic apparatus Grant 9,390,068 - Yoda July 12, 2	2016-07-12
Received Data Processing Apparatus Of Photoacoustic Tomography App 20160174850 - Baba; Yoshitaka ; et al.	2016-06-23
Object information acquiring apparatus Grant 9,364,152 - Oikawa , et al. June 14, 2	2016-06-14
Measurement apparatus, movement control method, and program Grant 9,247,881 - Yoda February 2, 2	2016-02-02
Received data processing apparatus of photoacoustic tomography Grant 9,247,923 - Baba , et al. February 2, 2	2016-02-02
Ultrasonic imaging apparatus and method of controlling delay Grant 9,165,552 - Oikawa , et al. October 20, 2	2015-10-20
Measuring apparatus Grant 9,116,225 - Yoda , et al. August 25, 2	2015-08-25
Object information acquiring apparatus Grant 9,063,220 - Yoda , et al. June 23, 2	2015-06-23
Acoustic wave imaging apparatus and acoustic wave imaging method Grant 8,929,174 - Yoda , et al. January 6, 2	2015-01-06
Photoacoustic imaging apparatus Grant 8,920,321 - Yoda December 30, 2	2014-12-30
Object Information Acquiring Apparatus And Method Of Controlling Same App 20140296689 - Yoda; Haruo	2014-10-02
Object Information Acquiring Apparatus App 20140269190 - Yoda; Haruo ; et al.	2014-09-18
Charged particle beam exposure apparatus Grant 8,692,218 - Muraki , et al. April 8, 2	2014-04-08
Object Information Acquiring Apparatus, Information Processing Apparatus And Object Information Acquiring Method App 20140058262 - Yoda; Haruo	2014-02-27
Object Information Acquiring Apparatus App 20140051970 - Ebisawa; Hisafumi ; et al.	2014-02-20
Signal Processing Circuit And Ultrasonic Diagnostic Apparatus App 20140052765 - Yoda; Haruo	2014-02-20
Object Information Acquiring Apparatus App 20140043941 - Yoda; Haruo	2014-02-13
Object Information Acquiring Apparatus App 20130308850 - Oikawa; Katsuya ; et al.	2013-11-21
Acoustic Wave Imaging Apparatus And Acoustic Wave Imaging Method App 20120314534 - Yoda; Haruo ; et al.	2012-12-13
Subject Information Acquisition Apparatus App 20120302864 - Yoda; Haruo	2012-11-29
Ultrasonic Imaging Apparatus And Method Of Controlling Delay App 20120281902 - Oikawa; Katsuya ; et al.	2012-11-08
Measurement Apparatus, Movement Control Method, And Program App 20120257472 - Yoda; Haruo	2012-10-11
Measuring Apparatus App 20120044785 - Yoda; Haruo ; et al.	2012-02-23
Charged Particle Beam Instrument Comprising An Aberration Corrector App 20110210248 - HIROSE; Kotoko ; et al.	2011-09-01
Electron beam apparatus and method of generating an electron beam irradiation pattern Grant 8,008,622 - Fujita , et al. August 30, 2	2011-08-30
Received Data Processing Apparatus Of Photoacoustic Tomography App 20110128816 - Baba; Yoshitaka ; et al.	2011-06-02
Method and apparatus for inspecting integrated circuit pattern Grant 7,952,074 - Shinada , et al. May 31, 2	2011-05-31
Photoacoustic Imaging Apparatus App 20110098550 - Yoda; Haruo	2011-04-28
Method for estimation of probe shape in charged particle beam instruments Grant 7,915,582 - Hirose , et al. March 29, 2	2011-03-29
Method For Estimation Of Probe Shape In Charged Particle Beam Instruments App 20100264309 - HIROSE; Kotoko ; et al.	2010-10-21
Charged particle beam exposure apparatus Grant 7,692,166 - Muraki , et al. April 6, 2	2010-04-06
Electron Beam Apparatus And Method of Generating An Electron Beam Irradiation Pattern App 20100078556 - Fujita; Ryo ; et al.	2010-04-01
Electron Beam Apparatus And Method Of Generating An Electron Beam Irradiation Pattern App 20100078555 - FUJITA; Ryo ; et al.	2010-04-01
Charged particle beam apparatus Grant 7,642,514 - Takane , et al. January 5, 2	2010-01-05
Electron beam apparatus and method of generating an electron beam irradiation pattern Grant 7,635,851 - Fujita , et al. December 22, 2	2009-12-22
Method And Apparatus For Inspecting Integrated Circuit Pattern App 20080302964 - Shinada; Hiroyuki ; et al.	2008-12-11
Method and apparatus for inspecting integrated circuit pattern Grant 7,417,444 - Shinada , et al. August 26, 2	2008-08-26
Charged particle beam apparatus App 20080116376 - Takane; Atsushi ; et al.	2008-05-22
Charged Particle Beam Exposure Apparatus App 20080067402 - Muraki; Masato ; et al.	2008-03-20
Charged Particle Beam Exposure Apparatus App 20080067403 - Muraki; Masato ; et al.	2008-03-20
Charged particle beam apparatus Grant 7,329,868 - Takane , et al. February 12, 2	2008-02-12
Semiconductor inspection system App 20070194236 - Takane; Atsushi ; et al.	2007-08-23
Semiconductor inspection system Grant 7,235,782 - Takane , et al. June 26, 2	2007-06-26
Electron beam apparatus and method of generating an electron beam irradiation pattern App 20070057200 - Fujita; Ryo ; et al.	2007-03-15
Charged particle beam apparatus App 20070023657 - Takane; Atsushi ; et al.	2007-02-01
Multi-electron beam exposure method and apparatus Grant 7,126,140 - Yoda , et al. October 24, 2	2006-10-24
Charged particle beam apparatus Grant 7,109,485 - Takane , et al. September 19, 2	2006-09-19
Method of charged particle beam lithography and equipment for charged particle beam lithography Grant 7,105,842 - Tanimoto , et al. September 12, 2	2006-09-12
Statistic calculating method using a template and corresponding sub-image to determine similarity based on sum of squares thresholding Grant 7,082,224 - Ikeda , et al. July 25, 2	2006-07-25
Multi-electron beam exposure method and apparatus Grant 7,067,830 - Yoda , et al. June 27, 2	2006-06-27
Charged particle beam exposure method, charged particle beam exposure apparatus, and device manufacturing method Grant 7,049,610 - Muraki , et al. May 23, 2	2006-05-23
Exposure apparatus and exposure method Grant 7,039,487 - Nagata , et al. May 2, 2	2006-05-02
Method and apparatus for inspecting integrated circuit pattern Grant 7,026,830 - Shinada , et al. April 11, 2	2006-04-11
Semiconductor inspection system Grant 7,026,615 - Takane , et al. April 11, 2	2006-04-11
Method and apparatus for inspecting integrated circuit pattern App 20060043982 - Shinada; Hiroyuki ; et al.	2006-03-02
Electron-beam drawing apparatus and electron-beam drawing method App 20060033050 - Ando; Kimiaki ; et al.	2006-02-16
Multi-electron beam exposure method and apparatus App 20060017021 - Yoda; Haruo ; et al.	2006-01-26
Charged particle beam drawing apparatus App 20050285054 - Inoue, Yuji ; et al.	2005-12-29
Charged particle beam exposure method and apparatus and device manufacturing method using the apparatus Grant 6,946,665 - Muraki , et al. September 20, 2	2005-09-20
Charged particle beam apparatus Grant 6,936,818 - Takane , et al. August 30, 2	2005-08-30
Charged particle beam apparatus App 20050184237 - Takane, Atsushi ; et al.	2005-08-25
Electron beam exposure apparatus, deflection apparatus, and electron beam exposure method Grant 6,919,574 - Hashimoto , et al. July 19, 2	2005-07-19
Electron beam exposure apparatus, electron beam exposure apparatus calibration method, and semiconductor element manufacturing method Grant 6,917,045 - Hashimoto , et al. July 12, 2	2005-07-12
Statistic calculating method using a template and corresponding sub-image to determine similarity based on sum of squares thresholding App 20050147305 - Ikeda, Mitsuji ; et al.	2005-07-07
Method of charged particle beam lithography and equipment for charged particle beam lithography App 20050072941 - Tanimoto, Sayaka ; et al.	2005-04-07
Exposure apparatus Grant 6,870,171 - Hosoda , et al. March 22, 2	2005-03-22
Charged particle beam exposure method and apparatus and device manufacturing method using the apparatus App 20050029473 - Muraki, Masato ; et al.	2005-02-10
Charged particle beam exposure method, charged particle beam exposure apparatus, and device manufacturing method App 20050006603 - Muraki, Masato ; et al.	2005-01-13
Charged particle beam drawing apparatus and pattern forming method Grant 6,831,283 - Yoda , et al. December 14, 2	2004-12-14
Electron beam lithography system Grant 6,828,573 - Kawano , et al. December 7, 2	2004-12-07
Exposure apparatus App 20040188636 - Hosoda, Masaki ; et al.	2004-09-30
Electron-beam drawing apparatus and electron-beam drawing method App 20040178366 - Ando, Kimiaki ; et al.	2004-09-16
Multi-electron beam exposure method and apparatus App 20040143356 - Yoda, Haruo ; et al.	2004-07-22
Method and apparatus for charged particle beam exposure Grant 6,759,666 - Nagata , et al. July 6, 2	2004-07-06
Charged particle beam apparatus App 20040069956 - Takane, Atsushi ; et al.	2004-04-15
Electron beam exposure apparatus, deflection apparatus, and electron beam exposure method App 20040061080 - Hashimoto, Shin-Ichi ; et al.	2004-04-01
Electron beam exposure apparatus, electron beam exposure apparatus calibration method, and semiconductor element manufacturing method App 20040061065 - Hashimoto, Shin-Ichi ; et al.	2004-04-01
Electron beam lithography system, electron beam lithography apparatus, and method of lithography Grant 6,674,086 - Kamada , et al. January 6, 2	2004-01-06
Electron beam exposure method, electron beam exposure apparatus and device manufacturing method using the same Grant 6,667,486 - Ohta , et al. December 23, 2	2003-12-23
Pattern inspecting system and pattern inspecting method Grant 6,661,507 - Yoda , et al. December 9, 2	2003-12-09
Charged particle beam apparatus Grant 6,653,633 - Takane , et al. November 25, 2	2003-11-25
Electron Beam Exposure Method, Electron Beam Exposure Apparatus And Device Manufacturing Method Using The Same App 20030189181 - Ohta, Hiroya ; et al.	2003-10-09
Semiconductor inspection system App 20030173516 - Takane, Atsushi ; et al.	2003-09-18
Method and apparatus for inspecting integrated circuit pattern App 20030169060 - Shinada, Hiroyuki ; et al.	2003-09-11
Charged particle beam drawing apparatus and pattern forming method App 20030146397 - Yoda, Haruo ; et al.	2003-08-07
Charged particle beam apparatus App 20030136907 - Takane, Atsushi ; et al.	2003-07-24
Electron beam exposure system and exposing method using an electron beam Grant 6,541,784 - Kawano , et al. April 1, 2	2003-04-01
Image-formation apparatus using charged particle beams under various focus conditions Grant 6,538,249 - Takane , et al. March 25, 2	2003-03-25
Semiconductor inspection system App 20020158199 - Takane, Atsushi ; et al.	2002-10-31
Electron Beam Lithography System, Electron Beam Lithography Apparatus, And Method Of Lithography App 20020145119 - KAMADA, MASATO ; et al.	2002-10-10
Pattern inspecting system and pattern inspecting method App 20020080347 - Yoda, Haruo ; et al.	2002-06-27
Method of inspecting a pattern on a substrate Grant 6,376,854 - Shishido , et al. April 23, 2	2002-04-23
Method and apparatus for charged particle beam exposure App 20020027198 - Nagata, Koji ; et al.	2002-03-07
Method and apparatus for inspecting integrated circuit pattern App 20020027440 - Shinada, Hiroyuki ; et al.	2002-03-07
Electron-beam drawing appraratus electron-beam drawing method App 20020024020 - Ando, Kimiaki ; et al.	2002-02-28
Method of inspecting pattern and apparatus thereof App 20010030300 - Shishido, Chie ; et al.	2001-10-18
Pattern inspecting system and pattern inspecting method App 20010009461 - Yoda, Haruo ; et al.	2001-07-26
Method of inspecting pattern and apparatus thereof with a differential brightness image detection Grant 6,236,057 - Shishido , et al. May 22, 2	2001-05-22
Method and apparatus for inspecting integrated circuit pattern Grant 6,172,363 - Shinada , et al. January 9, 2	2001-01-09
Method of inspecting pattern and apparatus thereof Grant 6,087,673 - Shishido , et al. July 11, 2	2000-07-11
Exposure method and pattern data preparation system therefor, pattern data preparation method and mask as well as exposure apparatus Grant 5,557,314 - Okamoto , et al. September 17, 1	1996-09-17
Charged particle beam exposure apparatus Grant 5,424,550 - Kawano , et al. June 13, 1	1995-06-13
Electron beam lithography using an aperture having an array of repeated unit patterns Grant 5,250,812 - Murai , et al. October 5, 1	1993-10-05
Motion control apparatus with function to self-form a series of motions Grant 5,063,492 - Yoda , et al. November 5, 1	1991-11-05
Pipe-lined data processor system of synchronous type having memory devices with buffer memory and input/output data control Grant 5,043,883 - Inouchi , et al. August 27, 1	1991-08-27
Electron beam exposure system Grant 4,532,598 - Shibayama , et al. July 30, 1	1985-07-30
Visual information processing apparatus Grant 4,346,405 - Yoda , et al. August 24, 1	1982-08-24
Image data processor Grant 4,254,400 - Yoda , et al. March 3, 1	1981-03-03
Group control system for visual information processing Grant 4,057,845 - Ejiri , et al. November 8, 1	1977-11-08
Pattern recognition system Grant 3,936,800 - Ejiri , et al. February 3, 1	1976-02-03
Inspection equipment for detecting and extracting small portion included in pattern Grant 3,887,762 - Uno , et al. June 3, 1	1975-06-03

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.