Ying; Huajun
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ying; Huajun.The latest application filed is for "unified neural network for defect detection and classification".
- Ying; Huajun - San Jose CA
| Patent | Date |
|---|---|
| Unified neural network for defect detection and classification Grant 10,607,119 - He , et al. | 2020-03-31 |
| Method and system for defect classification Grant 10,482,590 - He , et al. Nov | 2019-11-19 |
| Adaptive automatic defect classification Grant 10,436,720 - He , et al. O | 2019-10-08 |
| Unified Neural Network For Defect Detection And Classification App 20190073568 - He; Li ; et al. | 2019-03-07 |
| Method and System for Defect Classification App 20180114310 - He; Li ; et al. | 2018-04-26 |
| Method and system for defect classification Grant 9,898,811 - He , et al. February 20, 2 | 2018-02-20 |
| Accelerated Training Of A Machine Learning Based Model For Semiconductor Applications App 20170193400 - Bhaskar; Kris ; et al. | 2017-07-06 |
| Adaptive Automatic Defect Classification App 20170082555 - He; Li ; et al. | 2017-03-23 |
| Method and System for Defect Classification App 20160328837 - He; Li ; et al. | 2016-11-10 |
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