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name:-0.005993127822876
name:-0.010457038879395
name:-0.00070714950561523
Yin; Heyun Patent Filings

Yin; Heyun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yin; Heyun.The latest application filed is for "sputter etch material selectivity".

Company Profile
0.8.7
  • Yin; Heyun - Saugus MA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Sputter Etch Material Selectivity
App 20180174843 - Anglin; Kevin ;   et al.
2018-06-21
Sputter etch material selectivity
Grant 10,002,764 - Anglin , et al. June 19, 2
2018-06-19
Technique for processing a substrate having a non-planar surface
Grant 8,679,960 - Papasouliotis , et al. March 25, 2
2014-03-25
Method for processing a substrate having a non-planar substrate surface
Grant 8,507,372 - Papasouliotis , et al. August 13, 2
2013-08-13
Method For Processing A Substrate Having A Non-planar Substrate Surface
App 20120295430 - Papasouliotis; George D. ;   et al.
2012-11-22
Method of processing a substrate having a non-planar surface
Grant 8,202,792 - Papasouliotis , et al. June 19, 2
2012-06-19
Technique for Processing a Substrate Having a Non-Planar Surface
App 20110086501 - Papasouliotis; George D. ;   et al.
2011-04-14
Implantation of multiple species to address copper reliability
Grant 7,863,194 - Yin , et al. January 4, 2
2011-01-04
Method Of Processing A Substrate Having A Non-planar Surface
App 20100273322 - Papasouliotis; George D. ;   et al.
2010-10-28
Implantation Of Multiple Species To Address Copper Reliability
App 20100240201 - YIN; Heyun ;   et al.
2010-09-23
Implantation of multiple species to address copper reliability
Grant 7,737,013 - Yin , et al. June 15, 2
2010-06-15
Doped Layers for Reducing Electromigration
App 20100048018 - Gupta; Atul ;   et al.
2010-02-25
Implantation Of Multiple Species To Address Copper Reliability
App 20090117735 - YIN; Heyun ;   et al.
2009-05-07

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