Yim; Sung-Min

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yim; Sung-Min.The latest application filed is for "method of operating memory device and method of operating memory system including the same".

Company Profile

0.10.9

Yim; Sung-Min - Suwon-si KR
Yim; Sung-Min - Gyeonggi-do KR
Yim; Sung-min - Yongin KR
Yim; Sung-min - Kyungki-do KR
Yim; Sung-min - Pyungtaek KR
Yim, Sung-min - Pyungtaek-city KR
Yim, Sung-min - Yongin-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of operating memory device and method of operating memory system including the same Grant 9,472,258 - Shin , et al. October 18, 2	2016-10-18
Method Of Operating Memory Device And Method Of Operating Memory System Including The Same App 20160196863 - SHIN; Seung-Jun ; et al.	2016-07-07
Semiconductor memory device having improved refresh characteristics Grant 9,036,439 - Kim , et al. May 19, 2	2015-05-19
Semiconductor Memory Device Having Improved Refresh Characteristics App 20130016574 - Kim; Jung-sik ; et al.	2013-01-17
Semiconductor memory device and method for controlling clock latency according to reordering of burst data Grant 8,010,765 - Choi , et al. August 30, 2	2011-08-30
Driver circuits for integrated circuit devices that are operable to reduce gate induced drain leakage (GIDL) current in a transistor and methods of operating the same Grant 7,646,653 - Choi , et al. January 12, 2	2010-01-12
Data output circuit in semiconductor memory device Grant 7,590,010 - Park , et al. September 15, 2	2009-09-15
Data output circuit in semiconductor memory device App 20080170452 - Park; Taek-Seon ; et al.	2008-07-17
Semiconductor Memory Device And Method For Controlling Clock Latency According To Reordering Of Burst Data App 20080052482 - CHOI; Joo-Sun ; et al.	2008-02-28
Driver circuits for integrated circuit devices that are operable to reduce gate induced drain leakage (GIDL) current in a transistor and methods of operating the same App 20080031060 - Choi; Jong-Hyun ; et al.	2008-02-07
Apparatus and method for measuring electrical characteristics of a semiconductor element in a packaged semiconductor device Grant 6,853,175 - Yim , et al. February 8, 2	2005-02-08
Output drivers preventing degradation of channel bus line in a memory module equipped with semiconductor memory devices including the output drivers Grant 6,842,815 - Yim , et al. January 11, 2	2005-01-11
Semiconductor memory device having mesh-type structure of precharge voltage line Grant 6,707,738 - Choi , et al. March 16, 2	2004-03-16
Semiconductor memory device having mesh-type structure of precharge voltage line App 20030112679 - Choi, Jang-Seok ; et al.	2003-06-19
Apparatus and method for measuring electrical characteristics of a semiconductor element in a packaged semiconductor device App 20020063570 - Yim, Sung-min ; et al.	2002-05-30
Output drivers preventing degradation of channel bus line in a memory module equipped with semiconductor memory devices including the output drivers App 20010007115 - Yim, Sung-min ; et al.	2001-07-05
Semiconductor memory device with an extended data output mode Grant 5,661,688 - Yim , et al. August 26, 1	1997-08-26

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