Yiin; Lih-Huah

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yiin; Lih-Huah.The latest application filed is for "method and apparatus for database-assisted requalification reticle inspection".

Company Profile

0.10.6

Yiin; Lih-Huah - Mountain View CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for database-assisted requalification reticle inspection Grant 9,733,640 - Yiin , et al. August 15, 2	2017-08-15
Detection of thin lines for selective sensitivity during reticle inspection using processed images Grant 9,092,847 - Wang , et al. July 28, 2	2015-07-28
Method And Apparatus For Database-assisted Requalification Reticle Inspection App 20150005917 - Yiin; Lih-Huah ; et al.	2015-01-01
Detection Of Thin Lines For Selective Sensitivity During Reticle Inspection Using Processed Images App 20140369593 - Wang; Zhengyu ; et al.	2014-12-18
Detection of thin lines for selective sensitivity during reticle inspection using processed images Grant 8,855,400 - Wang , et al. October 7, 2	2014-10-07
Detection Of Thin Lines For Selective Sensitivity During Reticle Inspection Using Processed Images App 20130236083 - Wang; Zhengyu ; et al.	2013-09-12
Detection of thin line for selective sensitivity during reticle inspection Grant 8,090,189 - Phalke , et al. January 3, 2	2012-01-03
Method for detecting lithographically significant defects on reticles Grant 7,873,204 - Wihl , et al. January 18, 2	2011-01-18
Closed region defect detection system Grant 7,499,156 - Chen , et al. March 3, 2	2009-03-03
Method For Detecting Lithographically Significant Defects On Reticles App 20080170773 - Wihl; Mark J. ; et al.	2008-07-17
Closed region defect detection system App 20070035727 - Chen; George Q. ; et al.	2007-02-15
Visualization of photomask databases Grant 7,167,185 - Yiin , et al. January 23, 2	2007-01-23
Closed region defect detection system Grant 7,126,681 - Chen , et al. October 24, 2	2006-10-24
Multiple design database layer inspection Grant 7,027,635 - Wihl , et al. April 11, 2	2006-04-11

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