Patent | Date |
---|
Integrated Platform For Tin Pvd And High-k Ald For Beol Mim Capacitor App 20220310776 - WONG; Keith Tatseun ;   et al. | 2022-09-29 |
Methods And Apparatus For Processing A Substrate App 20220298636 - ASRANI; Soham Sunjay ;   et al. | 2022-09-22 |
Methods And Apparatus For Processing A Substrate App 20220301867 - TANNOS; Jethro ;   et al. | 2022-09-22 |
Process chamber for etching low k and other dielectric films Grant 11,410,860 - Lubomirsky , et al. August 9, 2 | 2022-08-09 |
Methods And Apparatus For Processing A Substrate App 20220230887 - SHEK; Meiyee ;   et al. | 2022-07-21 |
Multi-source ion beam etch system Grant 11,387,071 - Liang , et al. July 12, 2 | 2022-07-12 |
Methods and apparatuses for forming interconnection structures Grant 11,205,589 - Ren , et al. December 21, 2 | 2021-12-21 |
Process Chamber For Etching Low K And Other Dielectric Films App 20210134618 - Lubomirsky; Dmitry ;   et al. | 2021-05-06 |
PROCESS TO IMPROVE INTERFACE STATE DENSITY Dit ON DEEP TRENCH ISOLATION (DTI) FOR CMOS IMAGE SENSOR App 20210111222 - Li; Philip Hsin-hua ;   et al. | 2021-04-15 |
Methods And Apparatuses For Forming Interconnection Structures App 20210104434 - Ren; He ;   et al. | 2021-04-08 |
Multi-source Ion Beam Etch System App 20210104374 - Liang; Qiwei ;   et al. | 2021-04-08 |
Residual removal Grant 10,964,527 - Kim , et al. March 30, 2 | 2021-03-30 |
Method and system for three-dimensional (3D) structure fill Grant 10,943,779 - Yieh , et al. March 9, 2 | 2021-03-09 |
Process chamber for etching low K and other dielectric films Grant 10,923,367 - Lubomirsky , et al. February 16, 2 | 2021-02-16 |
Methods of patterning nickel silicide layers on a semiconductor device Grant 10,692,734 - Kim , et al. | 2020-06-23 |
Methods Of Patterning Nickel Silicide Layers On A Semiconductor Device App 20200135492 - KIM; JONG MUN ;   et al. | 2020-04-30 |
Residual Removal App 20190393024 - KIM; Jong Mun ;   et al. | 2019-12-26 |
Selective deposition of metal silicides Grant 10,475,655 - Hung , et al. Nov | 2019-11-12 |
Process Chamber For Etching Low K And Other Dielectric Films App 20180358244 - LUBOMIRSKY; Dmitry ;   et al. | 2018-12-13 |
Selective Deposition Of Metal Silicides App 20180342395 - HUNG; Raymond ;   et al. | 2018-11-29 |
Process chamber for etching low K and other dielectric films Grant 10,096,496 - Lubomirsky , et al. October 9, 2 | 2018-10-09 |
Low-temperature Atomic Layer Deposition Of Boron Nitride And Bn Structures App 20180040476 - WOLF; Steven ;   et al. | 2018-02-08 |
Process Chamber For Etching Low K And Other Dielectric Films App 20170229325 - LUBOMIRSKY; Dmitry ;   et al. | 2017-08-10 |
Process Chamber For Dielectric Gapfill App 20170226637 - Lubomirsky; Dmitry ;   et al. | 2017-08-10 |
Process chamber for etching low k and other dielectric films Grant 9,666,414 - Lubomirsky , et al. May 30, 2 | 2017-05-30 |
Method And System For Three-dimensional (3d) Structure Fill App 20170069488 - Yieh; Ellie ;   et al. | 2017-03-09 |
Method and system for three-dimensional (3D) structure fill Grant 9,530,674 - Yieh , et al. December 27, 2 | 2016-12-27 |
Method And System For Three-dimensional (3d) Structure Fill App 20150093907 - YIEH; Ellie ;   et al. | 2015-04-02 |
Method Of Depositing Thin Metal-organic Films App 20150079301 - NEMANI; Srinivas ;   et al. | 2015-03-19 |
Method of multiple patterning of a low-K dielectric film Grant 8,940,642 - Nemani , et al. January 27, 2 | 2015-01-27 |
Post etch treatment (PET) of a low-K dielectric film Grant 8,871,650 - Nemani , et al. October 28, 2 | 2014-10-28 |
Method of patterning a low-K dielectric film Grant 8,741,775 - Nemani , et al. June 3, 2 | 2014-06-03 |
Process Chamber For Dielectric Gapfill App 20140083362 - LUBOMIRSKY; Dmitry ;   et al. | 2014-03-27 |
Process Chamber For Etching Low K And Other Dielectric Films App 20130105303 - LUBOMIRSKY; Dmitry ;   et al. | 2013-05-02 |
Post Etch Treatment (pet) Of A Low-k Dielectric Film App 20130109187 - Nemani; Srinivas D. ;   et al. | 2013-05-02 |
Method Of Patterning A Low-k Dielectric Film App 20130023124 - Nemani; Srinivas D. ;   et al. | 2013-01-24 |
Method Of Multiple Patterning Of A Low-k Dielectric Film App 20130023122 - Nemani; Srinivas D. ;   et al. | 2013-01-24 |
High quality silicon oxide films by remote plasma CVD from disilane precursors Grant 8,242,031 - Mallick , et al. August 14, 2 | 2012-08-14 |
Dielectric deposition and etch back processes for bottom up gapfill Grant 8,232,176 - Lubomirsky , et al. July 31, 2 | 2012-07-31 |
Process Chamber For Dielectric Gapfill App 20120073501 - Lubomirsky; Dmitry ;   et al. | 2012-03-29 |
Post-deposition treatment to enhance properties of Si-O-C low K films Grant 8,143,174 - Xia , et al. March 27, 2 | 2012-03-27 |
High Quality Silicon Oxide Films By Remote Plasma Cvd From Disilane Precursors App 20110014798 - Mallick; Abhijit Basu ;   et al. | 2011-01-20 |
High quality silicon oxide films by remote plasma CVD from disilane precursors Grant 7,867,923 - Mallick , et al. January 11, 2 | 2011-01-11 |
Memory cell having stressed layers Grant 7,678,662 - Arghavani , et al. March 16, 2 | 2010-03-16 |
High Quality Silicon Oxide Films By Remote Plasma Cvd From Disilane Precursors App 20090104755 - Mallick; Abhijit Basu ;   et al. | 2009-04-23 |
Accelerated plasma clean Grant 7,506,654 - Chandran , et al. March 24, 2 | 2009-03-24 |
Method of forming a low-K dual damascene interconnect structure Grant 7,435,685 - Delgadino , et al. October 14, 2 | 2008-10-14 |
Method Of Forming A Low-k Dual Damascene Interconnect Structure App 20080145998 - DELGADINO; GERARDO A. ;   et al. | 2008-06-19 |
Post-deposition Treatment To Enhance Properties Of Si-o-c Low K Films App 20080132087 - Xia; Li-Qun ;   et al. | 2008-06-05 |
Post-deposition treatment to enhance properties of Si-O-C low k films Grant 7,326,657 - Xia , et al. February 5, 2 | 2008-02-05 |
Dielectric Deposition And Etch Back Processes For Bottom Up Gapfill App 20070298585 - Lubomirsky; Dmitry ;   et al. | 2007-12-27 |
Process Chamber For Dielectric Gapfill App 20070289534 - Lubomirsky; Dmitry ;   et al. | 2007-12-20 |
Process Chamber For Dielectric Gapfill App 20070281106 - Lubomirsky; Dmitry ;   et al. | 2007-12-06 |
Process Chamber For Dielectric Gapfill App 20070277734 - Lubomirsky; Dmitry ;   et al. | 2007-12-06 |
Gap-fill Depositions In The Formation Of Silicon Containing Dielectric Materials App 20070212850 - Ingle; Nitin K. ;   et al. | 2007-09-13 |
Memory Cell Having Stressed Layers App 20070132054 - Arghavani; Reza ;   et al. | 2007-06-14 |
Method of depositing low k films Grant 7,160,821 - Huang , et al. January 9, 2 | 2007-01-09 |
CVD plasma assisted lower dielectric constant SICOH film Grant 7,153,787 - Cho , et al. December 26, 2 | 2006-12-26 |
Method of depositing dielectric materials including oxygen-doped silicon carbide in damascene applications Grant 7,151,053 - Lee , et al. December 19, 2 | 2006-12-19 |
Method of forming a low-K dual damascene interconnect structure Grant 7,132,369 - Delgadino , et al. November 7, 2 | 2006-11-07 |
Method of depositing dielectric films Grant 7,117,064 - Nemani , et al. October 3, 2 | 2006-10-03 |
Method of decreasing the k value in sioc layer deposited by chemical vapor deposition Grant 7,074,708 - Gaillard , et al. July 11, 2 | 2006-07-11 |
Method and apparatus for deposition of low dielectric constant materials App 20060144334 - Yim; Kang Sub ;   et al. | 2006-07-06 |
Method of depositing dielectric films App 20060141805 - Nemani; Srinivas D. ;   et al. | 2006-06-29 |
Method and apparatus for deposition of low dielectric constant materials Grant 7,008,484 - Yim , et al. March 7, 2 | 2006-03-07 |
Method of depositing dielectric films Grant 7,001,850 - Nemani , et al. February 21, 2 | 2006-02-21 |
Method of depositing low k films App 20050260864 - Huang, Tzu-Fang ;   et al. | 2005-11-24 |
Method of depositing dielectric materials in damascene applications App 20050233576 - Lee, Ju-Hyung ;   et al. | 2005-10-20 |
CVD plasma assisted lower dielectric constant SICOH film Grant 6,943,127 - Cho , et al. September 13, 2 | 2005-09-13 |
Hardness improvement of silicon carboxy films Grant 6,936,309 - Li , et al. August 30, 2 | 2005-08-30 |
Solvent free photoresist strip and residue removal processing for post etching of low-k films App 20050158667 - Nguyen, Huong Thanh ;   et al. | 2005-07-21 |
CVD plasma assisted lower dielectric constant sicoh film App 20050153572 - Cho, Seon-Mee ;   et al. | 2005-07-14 |
Accelerated plasma clean App 20050103266 - Chandran, Shankar N. ;   et al. | 2005-05-19 |
Method of depositing dielectric materials in damascene applications Grant 6,890,850 - Lee , et al. May 10, 2 | 2005-05-10 |
Post-deposition treatment to enhance properties of Si-O-C low K films App 20050070128 - Xia, Li-Qun ;   et al. | 2005-03-31 |
Post-deposition treatment to enhance properties of Si-O-C low films Grant 6,858,923 - Xia , et al. February 22, 2 | 2005-02-22 |
Method of depositing dielectric films App 20050020048 - Nemani, Srinivas D. ;   et al. | 2005-01-27 |
Use of cyclic siloxanes for hardness improvement App 20040234688 - Singh, Vinita ;   et al. | 2004-11-25 |
Use of cyclic siloxanes for hardness improvement of low k dielectric films Grant 6,815,373 - Singh , et al. November 9, 2 | 2004-11-09 |
Accelerated plasma clean Grant 6,814,087 - Chandran , et al. November 9, 2 | 2004-11-09 |
Method of depositing low K films Grant 6,806,207 - Huang , et al. October 19, 2 | 2004-10-19 |
Method of decreasing the K value in SIOC layer deposited by chemical vapor deposition Grant 6,784,119 - Gaillard , et al. August 31, 2 | 2004-08-31 |
Method of decreasing the K value in SIOC layer deposited by chemical vapor deposition App 20040166665 - Gaillard, Frederic ;   et al. | 2004-08-26 |
Method of forming a low-K dual damascene interconnect structure App 20040157453 - Delgadino, Gerardo A. ;   et al. | 2004-08-12 |
Method of depositing dielectric films Grant 6,764,958 - Nemani , et al. July 20, 2 | 2004-07-20 |
Integration scheme for dual damascene structure Grant 6,753,258 - Gaillard , et al. June 22, 2 | 2004-06-22 |
Silicon carbide cap layers for low dielectric constant silicon oxide layers Grant 6,750,141 - Xia , et al. June 15, 2 | 2004-06-15 |
Purge heater design and process development for the improvement of low k film properties Grant 6,709,721 - Rocha-Alvarez , et al. March 23, 2 | 2004-03-23 |
Method of decreasing the K value in SIOC layer deposited by chemical vapor deposition App 20040029400 - Gaillard, Frederic ;   et al. | 2004-02-12 |
Solvent free photoresist strip and residue removal processing for post etching of low-k films Grant 6,680,164 - Nguyen , et al. January 20, 2 | 2004-01-20 |
Method and apparatus for processing semiconductor substrates with hydroxyl radicals App 20030221621 - Pokharna, Himanshu ;   et al. | 2003-12-04 |
Method and apparatus for deposition of low dielectric constant materials App 20030207033 - Yim, Kang Sub ;   et al. | 2003-11-06 |
Methods and apparatus to enhance properties of Si-O-C low K films Grant 6,635,575 - Xia , et al. October 21, 2 | 2003-10-21 |
Use of cyclic siloxanes for hardness improvement App 20030194880 - Singh, Vinita ;   et al. | 2003-10-16 |
Crosslink cyclo-siloxane compound with linear bridging group to form ultra low k dielectric App 20030194495 - Li, Lihua ;   et al. | 2003-10-16 |
Process for forming a low dielectric constant carbon-containing film Grant 6,632,478 - Gaillard , et al. October 14, 2 | 2003-10-14 |
Hardness improvement of silicon carboxy films App 20030186000 - Li, Lihua ;   et al. | 2003-10-02 |
Method of decreasing the K value in SiOC layer deposited by chemical vapor deposition Grant 6,627,532 - Gaillard , et al. September 30, 2 | 2003-09-30 |
Method of depositing low K films App 20030162410 - Huang, Tzu-Fang ;   et al. | 2003-08-28 |
Thermal CVD process for depositing a low dielectric constant carbon-doped silicon oxide film Grant 6,602,806 - Xia , et al. August 5, 2 | 2003-08-05 |
Method and apparatus for forming a dielectric film using helium as a carrier gas Grant 6,599,574 - Yieh , et al. July 29, 2 | 2003-07-29 |
Method of depositing low k films using an oxidizing plasma Grant 6,593,247 - Huang , et al. July 15, 2 | 2003-07-15 |
Method of depositing dielectric materials in damascene applications App 20030129827 - Lee, Ju-Hyung ;   et al. | 2003-07-10 |
Surface treatment of c-doped SiO2 film to enhance film stability during O2 ashing Grant 6,583,497 - Xia , et al. June 24, 2 | 2003-06-24 |
CVD plasma assisted lower dielectric constant sicoh film App 20030104708 - Cho, Seon-Mee ;   et al. | 2003-06-05 |
Solvent free photoresist strip and residue removal processing for post etching of low-k films App 20030104320 - Nguyen, Huong Thanh ;   et al. | 2003-06-05 |
Method of depositing organosilicate layers Grant 6,573,196 - Gaillard , et al. June 3, 2 | 2003-06-03 |
Method for cleaning a process chamber Grant 6,569,257 - Nguyen , et al. May 27, 2 | 2003-05-27 |
Post-deposition treatment to enhance properties of SI-O-C low films App 20030077857 - Xia, Li-Qun ;   et al. | 2003-04-24 |
Method of depositing organosillicate layers Grant 6,531,398 - Gaillard , et al. March 11, 2 | 2003-03-11 |
Silicon carbide cap layers for low dielectric constant silicon oxide layers App 20030013295 - Xia, Li-Qun ;   et al. | 2003-01-16 |
Surface treatment of c-doped SiO2 film to enhance film stability during 02 ashing App 20030008528 - Xia, Li-Qun ;   et al. | 2003-01-09 |
Dual frequency plasma enhanced chemical vapor deposition of silicon carbide layers App 20030008069 - Nemani, Srinivas ;   et al. | 2003-01-09 |
Multistep chamber cleaning and film deposition process using a remote plasma that also enhances film gap fill Grant 6,503,843 - Xia , et al. January 7, 2 | 2003-01-07 |
Cvd Plasma Assisted Lower Dielectric Constant Sicoh Film App 20030003768 - Cho, Seon-Mee ;   et al. | 2003-01-02 |
Method of depositing organosilicate layers Grant 6,500,773 - Gaillard , et al. December 31, 2 | 2002-12-31 |
Optical Marker Layer For Etch Endpoint Determination App 20020192845 - Nguyen, Huong Thanh ;   et al. | 2002-12-19 |
Purge heater design and process development for the improvement of low k film properties App 20020187262 - Rocha-Alvarez, Juan Carlos ;   et al. | 2002-12-12 |
Post-deposition treatment to enhance properties of Si-O-C low K films Grant 6,486,061 - Xia , et al. November 26, 2 | 2002-11-26 |
CVD plasma assisted lower dielectric constant sicoh film Grant 6,486,082 - Cho , et al. November 26, 2 | 2002-11-26 |
Two-step flourinated-borophosophosilicate glass deposition process App 20020173169 - Campana, Francimar ;   et al. | 2002-11-21 |
Methods for forming a low dielectric constant carbon-containing film, and films produced thereby App 20020164429 - Gaillard, Frederic ;   et al. | 2002-11-07 |
Method for planarizing organosilicate layers App 20020160692 - Rivoire, Maurice ;   et al. | 2002-10-31 |
Silicon carbide cap layers for low dielectric constant silicon oxide layers Grant 6,472,333 - Xia , et al. October 29, 2 | 2002-10-29 |
Surface treatment of C-doped SiO2 film to enhance film stability during O2 ashing Grant 6,465,372 - Xia , et al. October 15, 2 | 2002-10-15 |
Dual frequency plasma enhanced chemical vapor deposition of silicon carbide layers Grant 6,465,366 - Nemani , et al. October 15, 2 | 2002-10-15 |
Plasma treatment of organosilicate layers App 20020142104 - Nemani, Srinivas ;   et al. | 2002-10-03 |
Silicon Carbide Cap Layers For Low Dielectric Constant Silicon Oxide Layers App 20020142578 - Xia, Li-Qun ;   et al. | 2002-10-03 |
Method and apparatus for forming material layers from atomic gasses App 20020119673 - Yieh, Ellie ;   et al. | 2002-08-29 |
Accelerated plasma clean App 20020104467 - Chandran, Shankar N. ;   et al. | 2002-08-08 |
Interface with dielectric layer and method of making App 20020102856 - Xia, Li-Qun ;   et al. | 2002-08-01 |
Method of reducing undesired etching of insulation due to elevated boron concentrations Grant 6,426,015 - Xia , et al. July 30, 2 | 2002-07-30 |
Formation of a liquid-like silica layer by reaction of an organosilicon compound and a hydroxyl forming compound Grant 6,413,583 - Moghadam , et al. July 2, 2 | 2002-07-02 |
Accelerated plasma clean Grant 6,374,831 - Chandran , et al. April 23, 2 | 2002-04-23 |
Sub-atmospheric chemical vapor deposition system with dopant bypass Grant 6,360,685 - Xia , et al. March 26, 2 | 2002-03-26 |
Methods and apparatus for depositing premetal dielectric layer at sub-atmospheric and high temperature conditions Grant 6,348,099 - Xia , et al. February 19, 2 | 2002-02-19 |
Methods and apparatus for gettering fluorine from chamber material surfaces Grant 6,347,636 - Xia , et al. February 19, 2 | 2002-02-19 |
Method And Apparatus For Forming Material Layers From Atomic Gasses App 20010052323 - YIEH, ELLIE ;   et al. | 2001-12-20 |
Dielectric film deposition employing a bistertiarybutylaminesilane precursor App 20010000476 - Xia, Li-Qun ;   et al. | 2001-04-26 |
Two-step borophosphosilicate glass deposition process and related devices and apparatus Grant 6,218,268 - Xia , et al. April 17, 2 | 2001-04-17 |
Cleaning process end point determination using throttle valve position Grant 6,170,492 - Ueda , et al. January 9, 2 | 2001-01-09 |
Method for forming low compressive stress fluorinated ozone/TEOS oxide film Grant 6,121,164 - Yieh , et al. September 19, 2 | 2000-09-19 |
Deposition resistant lining for CVD chamber Grant 6,117,244 - Bang , et al. September 12, 2 | 2000-09-12 |
Methods for shallow trench isolation Grant 6,114,216 - Yieh , et al. September 5, 2 | 2000-09-05 |
Lid assembly for a process chamber employing asymmetric flow geometries Grant 6,110,556 - Bang , et al. August 29, 2 | 2000-08-29 |
Methods and apparatus for forming ultra-shallow doped regions using doped silicon oxide films Grant 6,099,647 - Yieh , et al. August 8, 2 | 2000-08-08 |
Methods and apparatus for forming ultra-shallow doped regions using doped silicon oxide films Grant 5,994,209 - Yieh , et al. November 30, 1 | 1999-11-30 |
Methods for depositing premetal dielectric layer at sub-atmospheric and high temperature conditions Grant 5,963,840 - Xia , et al. October 5, 1 | 1999-10-05 |
Method and apparatus for gettering fluorine from chamber material surfaces Grant 5,935,340 - Xia , et al. August 10, 1 | 1999-08-10 |
Methods and apparatus for cleaning surfaces in a substrate processing system Grant 5,812,403 - Fong , et al. September 22, 1 | 1998-09-22 |
Method for depositing ozone/TEOS silicon oxide films of reduced surface sensitivity Grant 5,356,722 - Nguyen , et al. October 18, 1 | 1994-10-18 |