YEOH; Boon Lian
Patent Applications and Registrations
Patent applications and USPTO patent grants for YEOH; Boon Lian.The latest application filed is for "defect localization in embedded memory".
- YEOH; Boon Lian - Johor Bahru SG
- Yeoh; Boon Lian - Teluk Intan MY
| Patent | Date |
|---|---|
| Defect Localization In Embedded Memory App 20210199715 - GOH; Szu Huat (Wu Shifa) ; et al. | 2021-07-01 |
| Defect localization in embedded memory Grant 10,962,592 - Goh , et al. March 30, 2 | 2021-03-30 |
| Defect Localization In Embedded Memory App 20200081061 - GOH; Szu Huat (Wu Shifa) ; et al. | 2020-03-12 |
| Defect isolation methods and systems Grant 9,958,502 - Goh , et al. May 1, 2 | 2018-05-01 |
| Defect isolation methods and systems Grant 9,739,831 - Goh , et al. August 22, 2 | 2017-08-22 |
| Defect Isolation Methods And Systems App 20160161556 - GOH; Szu Huat ; et al. | 2016-06-09 |
| Defect Isolation Methods And Systems App 20160047858 - GOH; Szu Huat ; et al. | 2016-02-18 |
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