Yen; Jimmy
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yen; Jimmy.The latest application filed is for "inspection methods for defects in electrophoretic display and related devices".
- Yen; Jimmy - San Jose CA
| Patent | Date |
|---|---|
| Inspection methods for defects in electrophoretic display and related devices Grant 7,982,479 - Wang , et al. July 19, 2 | 2011-07-19 |
| Inspection Methods For Defects In Electrophoretic Display And Related Devices App 20080169821 - Wang; Wanheng ; et al. | 2008-07-17 |
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