Patent | Date |
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Memory Device And Operating Method Thereof App 20220139493 - Yeh; Jun-Lin | 2022-05-05 |
Inspection method for memory integrity, nonvolatile memory and electronic device Grant 10,762,970 - Yeh Sep | 2020-09-01 |
Memory device and program/erase method therefor Grant 10,566,060 - Yeh Feb | 2020-02-18 |
Memory Device And Program/erase Method Therefor App 20190244670 - YEH; Jun-Lin | 2019-08-08 |
Inspection Method For Memory Integrity, Nonvolatile Memory And Electronic Device App 20190198122 - Yeh; Jun-Lin | 2019-06-27 |
Flash memory storage device and operating method thereof Grant 10,249,376 - Yeh | 2019-04-02 |
Flash Memory Storage Device And Operating Method Thereof App 20180336954 - Yeh; Jun-Lin | 2018-11-22 |
Multi-zone temperature control for semiconductor wafer Grant 10,113,233 - Chang , et al. October 30, 2 | 2018-10-30 |
Dummy structure for chip-on-wafer-on-substrate Grant 9,754,831 - Kuo , et al. September 5, 2 | 2017-09-05 |
Multi-zone Temperature Control For Semiconductor Wafer App 20170022611 - CHANG; Chun-Lin ;   et al. | 2017-01-26 |
Dummy Structure for Chip-on-Wafer-on-Substrate App 20160358818 - Kuo; Pei-Ching ;   et al. | 2016-12-08 |
Dummy structure for chip-on-wafer-on-substrate Grant 9,425,126 - Kuo , et al. August 23, 2 | 2016-08-23 |
Storage medium and accessing system utilizing the same Grant 9,281,020 - Yeh March 8, 2 | 2016-03-08 |
Memory cell structure and formation method thereof Grant 9,214,495 - Yeh , et al. December 15, 2 | 2015-12-15 |
Dummy Structure for Chip-on-Wafer-on-Substrate App 20150348872 - Kuo; Pei-Ching ;   et al. | 2015-12-03 |
Flash memory apparatus and data reading method thereof Grant 9,136,008 - Yeh , et al. September 15, 2 | 2015-09-15 |
Flash memory apparatus with serial interface and reset method thereof Grant 9,104,401 - Yeh , et al. August 11, 2 | 2015-08-11 |
Multi-zone Temperature Control For Semiconductor Wafer App 20150211122 - CHANG; Chun-Lin ;   et al. | 2015-07-30 |
Multi-zone temperature control for semiconductor wafer Grant 9,023,664 - Chang , et al. May 5, 2 | 2015-05-05 |
Flash Memory Apparatus With Serial Interface And Reset Method Thereof App 20150058544 - Yeh; Jun-Lin ;   et al. | 2015-02-26 |
Flash memory apparatus with serial interface and reset method thereof Grant 8,914,569 - Yeh , et al. December 16, 2 | 2014-12-16 |
Flash memory and layout method thereof Grant 8,885,383 - Yeh , et al. November 11, 2 | 2014-11-11 |
Storage Medium And Accessing System Utilizing The Same App 20140122813 - YEH; Jun-Lin | 2014-05-01 |
Multi-zone Temperature Control For Semiconductor Wafer App 20130171746 - Chang; Chun-Lin ;   et al. | 2013-07-04 |
Method of fabricating a sealing structure for high-k metal gate Grant 8,450,161 - Chen , et al. May 28, 2 | 2013-05-28 |
Multi-zone temperature control for semiconductor wafer Grant 8,404,572 - Chang , et al. March 26, 2 | 2013-03-26 |
Flash Memory And Flash Memory Accessing Method App 20120246384 - Lin; Chi-Cheng ;   et al. | 2012-09-27 |
Sealing Structure For High-k Metal Gate And Method Of Making App 20120225529 - Chen; Chieh-Hao ;   et al. | 2012-09-06 |
Flash Memory Apparatus With Serial Interface And Reset Method Thereof App 20120221766 - Yeh; Jun-Lin ;   et al. | 2012-08-30 |
Sealing structure for high-K metal gate Grant 8,193,586 - Chen , et al. June 5, 2 | 2012-06-05 |
Multi-zone Temperature Control For Semiconductor Wafer App 20100210041 - Chang; Chun-Lin ;   et al. | 2010-08-19 |
Sealing Structure For High-k Metal Gate And Method Of Making App 20100044803 - Chen; Chien-Hao ;   et al. | 2010-02-25 |
Device and method for compensating defect in semiconductor memory Grant 7,203,107 - Yeh April 10, 2 | 2007-04-10 |
Device And Method For Compensating Defect In Semiconductor Memory App 20060203579 - Yeh; Jun-Lin | 2006-09-14 |
Device and method for compensating defect in semiconductor memory Grant 7,020,003 - Yeh March 28, 2 | 2006-03-28 |
[device And Method For Compensating Defect In Semiconductor Memory] App 20050174827 - Yeh, Jun-Lin | 2005-08-11 |
Current sense amplifier with dynamic pre-charge App 20030133328 - Yeh, Jun-Lin | 2003-07-17 |