Yedur; Sanjay

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yedur; Sanjay.The latest application filed is for "determining one or more profile parameters of a photomask covered by a pellicle".

Company Profile

0.8.7

Yedur; Sanjay - Fremont CA
Yedur; Sanjay - San Jose CA
Yedur; Sanjay - San Ramon CA
Yedur; Sanjay - Santa Clara CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Determining one or more profile parameters of a photomask covered by a pellicle Grant 7,702,471 - Li , et al. April 20, 2	2010-04-20
Determining transmittance of a photomask using optical metrology Grant 7,639,375 - Yedur , et al. December 29, 2	2009-12-29
Evaluating a profile model to characterize a structure to be examined using optical metrology Grant 7,518,740 - Chard , et al. April 14, 2	2009-04-14
Automated process control using parameters determined from a photomask covered by a pellicle Grant 7,480,062 - Li , et al. January 20, 2	2009-01-20
Determining One Or More Profile Parameters Of A Photomask Covered By A Pellicle App 20080291467 - LI; SHIFANG ; et al.	2008-11-27
Automated Process Control Using Parameters Determined From A Photomask Covered By A Pellicle App 20080291429 - LI; SHIFANG ; et al.	2008-11-27
Selecting a hypothetical profile to use in optical metrology Grant 7,394,554 - Vuong , et al. July 1, 2	2008-07-01
Determining transmittance of a photomask using optical metrology App 20080144919 - Yedur; Sanjay ; et al.	2008-06-19
Evaluating a profile model to characterize a structure to be examined using optical metrology App 20080007738 - Chard; Jeffrey A. ; et al.	2008-01-10
Optimized model and parameter selection for optical metrology Grant 7,092,110 - Balasubramanian , et al. August 15, 2	2006-08-15
Edge roughness measurement in optical metrology Grant 7,046,375 - Bischoff , et al. May 16, 2	2006-05-16
Selecting a hypothetical profile to use in optical metrology App 20050057748 - Vuong, Vi ; et al.	2005-03-17
Edge roughness measurement in optical metrology App 20040218192 - Bischoff, Joerg ; et al.	2004-11-04
Optimized model and parameter selection for optical metrology App 20040017575 - Balasubramanian, Raghu ; et al.	2004-01-29
Carbonized antireflective coating produced by spin-on polymer material Grant 6,117,618 - Yedur , et al. September 12, 2	2000-09-12

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