Yati; Arpit

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yati; Arpit.The latest application filed is for "semiconductor overlay measurements using machine learning".

Company Profile

9.9.12

Yati; Arpit - Lucknow IN
Yati; Arpit - Chennai IN
Yati; Arpit - Uttar Pradesh IN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems and methods for predicting defects and critical dimension using deep learning in the semiconductor manufacturing process Grant 11,275,361 - Yati March 15, 2	2022-03-15
Semiconductor Overlay Measurements using Machine Learning App 20210407073 - Yati; Arpit	2021-12-30
Deep learning based adaptive regions of interest for critical dimension measurements of semiconductor substrates Grant 11,094,053 - Yati August 17, 2	2021-08-17
Inspection-guided critical site selection for critical dimension measurement Grant 11,035,666 - Saraswatula , et al. June 15, 2	2021-06-15
Defect discovery using electron beam inspection and deep learning with real-time intelligence to reduce nuisance Grant 10,970,834 - Yati April 6, 2	2021-04-06
Guided scanning electron microscopy metrology based on wafer topography Grant 10,957,608 - Yati , et al. March 23, 2	2021-03-23
System and Method for Rendering SEM Images and Predicting Defect Imaging Conditions of Substrates Using 3D Design App 20210026338 - Yati; Arpit ; et al.	2021-01-28
Care areas for improved electron beam defect detection Grant 10,692,690 - Anantha , et al.	2020-06-23
Deep Learning Based Adaptive Regions of Interest for Critical Dimension Measurements of Semiconductor Substrates App 20200111206 - Yati; Arpit	2020-04-09
Region Of Interest And Pattern Of Interest Generation For Critical Dimension Measurement App 20190279914 - Saraswatula; Jagdish Chandra ; et al.	2019-09-12
Defect Discovery Using Electron Beam Inspection And Deep Learning With Real-time Intelligence To Reduce Nuisance App 20190213733 - YATI; Arpit	2019-07-11
Automatic deskew using design files or inspection images Grant 10,204,416 - Jain , et al. Feb	2019-02-12
Inspection-guided Critical Site Selection For Critical Dimension Measurement App 20190041202 - SARASWATULA; Jagdish Chandra ; et al.	2019-02-07
Systems And Methods For Predicting Defects And Critical Dimension Using Deep Learning In The Semiconductor Manufacturing Process App 20190004504 - Yati; Arpit	2019-01-03
Guided Metrology Based on Wafer Topography App 20180315670 - Yati; Arpit ; et al.	2018-11-01
Care Areas for Improved Electron Beam Defect Detection App 20180277337 - Anantha; Vidyasagar ; et al.	2018-09-27
Range-based real-time scanning electron microscope non-visual binner Grant 9,947,596 - Kumar Roy , et al. April 17, 2	2018-04-17
Pre-layer defect site review using design Grant 9,940,704 - Yati April 10, 2	2018-04-10
Automatic Deskew Using Design Files Or Inspection Images App 20170228866 - Jain; Arpit ; et al.	2017-08-10
Range-Based Real-Time Scanning Electron Microscope Non-Visual Binner App 20170040142 - Kumar Roy; Hemanta ; et al.	2017-02-09
Pre-layer Defect Site Review Using Design App 20160371831 - YATI; Arpit	2016-12-22

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