Yasuzawa; Kenichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yasuzawa; Kenichi.The latest application filed is for "automatic analysis device and specimen inspection automation system".
- Yasuzawa; Kenichi - Hitachinaka JP
- Yasuzawa; Kenichi - Tokyo JP
| Patent | Date |
|---|---|
| Sample test automation system Grant 10,816,564 - Sasaki , et al. October 27, 2 | 2020-10-27 |
| Automatic analysis device and specimen inspection automation system Grant 10,768,187 - Yasuzawa , et al. Sep | 2020-09-08 |
| Automatic Analysis Device And Specimen Inspection Automation System App 20180203027 - YASUZAWA; Kenichi ; et al. | 2018-07-19 |
| Sample inspection automation system and sample transfer method Grant 9,952,239 - Yasuzawa , et al. April 24, 2 | 2018-04-24 |
| Sample Test Automation System App 20170328926 - SASAKI; Takahiro ; et al. | 2017-11-16 |
| Sample test automation system Grant 9,753,048 - Sasaki , et al. September 5, 2 | 2017-09-05 |
| Sample inspection automation system Grant 9,645,161 - Yasuzawa , et al. May 9, 2 | 2017-05-09 |
| Sample Inspection Automation System And Sample Transfer Method App 20150192598 - Yasuzawa; Kenichi ; et al. | 2015-07-09 |
| Sample Inspection Automation System App 20140208872 - Yasuzawa; Kenichi ; et al. | 2014-07-31 |
| Sample Test Automation System App 20130061693 - Sasaki; Takahiro ; et al. | 2013-03-14 |
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