Yasutake; Masatoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yasutake; Masatoshi.The latest application filed is for "particle measuring device and particle measuring method".

Company Profile

3.45.27

Yasutake; Masatoshi - Tokyo JP
Yasutake; Masatoshi - Chiba N/A JP
YASUTAKE; Masatoshi - Chiba-shi JP
Yasutake; Masatoshi - Shizuoka JP
Yasutake; Masatoshi - Sunto-gun JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Particle measuring device and particle measuring method Grant 11,143,606 - Hashizume , et al. October 12, 2	2021-10-12
Particle Measuring Device And Particle Measuring Method App 20200371050 - Hashizume; Tomihiro ; et al.	2020-11-26
Sample for measuring particles, method for measuring particles and apparatus for measuring particles Grant 10,697,767 - Hashizume , et al.	2020-06-30
Sample For Measuring Particles, Method For Measuring Particles And Apparatus For Measuring Particles App 20190178640 - HASHIZUME; Tomihiro ; et al.	2019-06-13
Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus Grant 8,657,962 - Hayashi , et al. February 25, 2	2014-02-25
Friction force microscope Grant 8,601,609 - Yasutake , et al. December 3, 2	2013-12-03
Friction Force Microscope App 20120227139 - YASUTAKE; Masatoshi ; et al.	2012-09-06
Conductivity measuring apparatus and conductivity measuring method Grant 8,111,079 - Yasutake , et al. February 7, 2	2012-02-07
Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method Grant 8,062,494 - Iwata , et al. November 22, 2	2011-11-22
AFM tweezers, method for producing AFM tweezers, and scanning probe microscope Grant 8,028,567 - Kobayashi , et al. October 4, 2	2011-10-04
Positioning apparatus and scanning probe microscope employing the same Grant 8,001,831 - Watanabe , et al. August 23, 2	2011-08-23
Tweezer-equipped scanning probe microscope and transfer method Grant 7,987,703 - Konno , et al. August 2, 2	2011-08-02
Sample manipulating apparatus Grant 7,926,328 - Yasutake , et al. April 19, 2	2011-04-19
Sample operation apparatus Grant 7,866,205 - Yasutake , et al. January 11, 2	2011-01-11
Sample operation apparatus Grant 7,770,474 - Yasutake , et al. August 10, 2	2010-08-10
Conductivity measuring apparatus and conductivity measuring method App 20090206855 - Yasutake; Masatoshi	2009-08-20
Tweezers System For Scanning Probe Microscope, Scanning Probe Microscope Apparatus And Method Of Removing Dust App 20090188011 - Yasutake; Masatoshi	2009-07-23
Probe microscope system suitable for observing sample of long body Grant 7,507,957 - Fujihira , et al. March 24, 2	2009-03-24
Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes Grant 7,495,215 - Akinaga , et al. February 24, 2	2009-02-24
Method for fabricating nanometer-scale structure Grant 7,476,418 - Yasutake , et al. January 13, 2	2009-01-13
AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope App 20090000365 - KOBAYASHI; Tatsuya ; et al.	2009-01-01
Sample Manipulating Apparatus App 20080314131 - Yasutake; Masatoshi ; et al.	2008-12-25
Tweezer-Equipped Scanning Probe Microscope and Transfer Method App 20080295585 - Konno; Takashi ; et al.	2008-12-04
Working method using scanning probe Grant 7,442,925 - Yasutake , et al. October 28, 2	2008-10-28
Probe for a scanning microscope Grant 7,398,678 - Nakayama , et al. July 15, 2	2008-07-15
Probe For A Scanning Magnetic Force Microscope, Method For Producing The Same, And Method For Forming Ferromagnetic Alloy Film On Carbon Nanotubes App 20080166560 - Akinaga; Hiroyuki ; et al.	2008-07-10
Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method App 20080132151 - Iwata; Futoshi ; et al.	2008-06-05
Processing probe Grant 7,378,654 - Wakiyama , et al. May 27, 2	2008-05-27
Scanning probe microscope and scanning method Grant 7,373,806 - Kitajima , et al. May 20, 2	2008-05-20
Sample Operation Apparatus App 20080105044 - Yasutake; Masatoshi ; et al.	2008-05-08
Sample Operation Apparatus App 20080105043 - Yasutake; Masatoshi ; et al.	2008-05-08
Processing method using atomic force microscope microfabrication device App 20070278177 - Kondo; Kazushige ; et al.	2007-12-06
Method of processing vertical cross-section using atomic force microscope Grant 7,278,299 - Takaoka , et al. October 9, 2	2007-10-09
Processing method using probe of scanning probe microscope Grant 7,259,372 - Takaoka , et al. August 21, 2	2007-08-21
Method of removing particle of photomask using atomic force microscope Grant 7,232,995 - Takaoka , et al. June 19, 2	2007-06-19
Working method using scanning probe App 20060219901 - Yasutake; Masatoshi ; et al.	2006-10-05
Probe for a scanning microscope App 20060150720 - Nakayama; Yoshikazu ; et al.	2006-07-13
Probe microscope system suitable for observing sample of long body App 20060060778 - Fujihira; Masamichi ; et al.	2006-03-23
Method of removing particle of photomask using atomic force microscope App 20060022134 - Takaoka; Osamu ; et al.	2006-02-02
Method of processing vertical cross-section using atomic force microscope App 20050262685 - Takaoka, Osamu ; et al.	2005-12-01
Processing method using probe of scanning probe microscope App 20050263700 - Takaoka, Osamu ; et al.	2005-12-01
Processing probe App 20050199809 - Wakiyama, Shigeru ; et al.	2005-09-15
Method for fabricating nanometer-scale structure App 20050089463 - Yasutake, Masatoshi ; et al.	2005-04-28
Scanning probe microscope and scanning method App 20050050947 - Kitajima, Itaru ; et al.	2005-03-10
Probe for scanning probe microscope Grant 6,864,481 - Kaito , et al. March 8, 2	2005-03-08
Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof Grant 6,817,231 - Yasutake , et al. November 16, 2	2004-11-16
Preparation of sample chip, method of observing wall surface thereof and system therefor App 20040185586 - Yasutake, Masatoshi ; et al.	2004-09-23
Conductive probe for scanning microscope and machining method using the same Grant 6,787,769 - Nakayama , et al. September 7, 2	2004-09-07
Method and system for surface or cross-sectional processing and observation App 20040154744 - Kaito, Takashi ; et al.	2004-08-12
Probe for scanning microscope produced by focused ion beam machining Grant 6,759,653 - Nakayama , et al. July 6, 2	2004-07-06
Cantilever for vertical scanning microscope and probe for vertical scan microscope Grant 6,705,154 - Nakayama , et al. March 16, 2	2004-03-16
Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof App 20030172726 - Yasutake, Masatoshi ; et al.	2003-09-18
Scanning probe microscope Grant 6,593,571 - Yasutake July 15, 2	2003-07-15
Probe for scanning probe microscope App 20030122072 - Kaito, Takashi ; et al.	2003-07-03
Cantilever for vertical scanning microscope and probe for vertical scan microscope App 20030010100 - Nakayama, Yoshikazu ; et al.	2003-01-16
Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof Grant 6,355,495 - Fujino , et al. March 12, 2	2002-03-12
Scanning probe microscope Grant 6,291,822 - Umemoto , et al. September 18, 2	2001-09-18
Probe scanning device Grant 6,051,833 - Yasutake April 18, 2	2000-04-18
Scanning probe microscope and micro-area processing machine both having micro-positioning mechanism Grant 5,945,671 - Yasutake August 31, 1	1999-08-31
Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same Grant 5,877,035 - Fujino , et al. March 2, 1	1999-03-02
Scanning probe microscope and method for obtaining topographic image, surface potential image, and electrostatic capacitance distribution image Grant 5,742,172 - Yasutake April 21, 1	1998-04-21
Optical scanning system utilizing an atomic force microscope and an optical microscope Grant 5,650,614 - Yasutake , et al. July 22, 1	1997-07-22
Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field Grant 5,623,205 - Tomita , et al. April 22, 1	1997-04-22
Surface analyzing and processing apparatus Grant 5,440,122 - Yasutake August 8, 1	1995-08-08
Scanning probe microscope Grant 5,440,121 - Yasutake , et al. August 8, 1	1995-08-08
Scanning probe microscope having a directional coupler and a Z-direction distance adjusting piezoelectric element Grant 5,324,935 - Yasutake June 28, 1	1994-06-28
Composite scanning tunneling microscope Grant 5,142,145 - Yasutake August 25, 1	1992-08-25
Composite scanning tunnelling microscope with a positioning function Grant 5,117,110 - Yasutake May 26, 1	1992-05-26
Scanning tunneling microscope Grant 4,999,495 - Miyata , et al. March 12, 1	1991-03-12
Method and apparatus for determining photo-chemical reaction heat Grant 4,126,032 - Ikeda , et al. November 21, 1	1978-11-21

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.