Yasuhara; Akira
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yasuhara; Akira.The latest application filed is for "beam alignment method and electron microscope".
- Yasuhara; Akira - Tokyo JP
| Patent | Date |
|---|---|
| Beam alignment method and electron microscope Grant 10,020,162 - Shimizu , et al. July 10, 2 | 2018-07-10 |
| Beam Alignment Method and Electron Microscope App 20170301507 - Shimizu; Yuko ; et al. | 2017-10-19 |
| Electron microscope and elemental mapping image generation method Grant 9,627,175 - Morita , et al. April 18, 2 | 2017-04-18 |
| Electron Microscope and Elemental Mapping Image Generation Method App 20160111248 - Morita; Masaki ; et al. | 2016-04-21 |
| Method and system for acquisition of confocal STEM images Grant 8,253,101 - Yasuhara August 28, 2 | 2012-08-28 |
| Method and System for Acquisition of Confocal Stem Images App 20110062326 - Yasuhara; Akira | 2011-03-17 |
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