Yang; Yongying
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yang; Yongying.The latest application filed is for "real-time traceability method of width of defect based on divide-and-conquer".
- Yang; Yongying - Hangzhou Zhejiang
- Yang; Yongying - Zhejiang CN
| Patent | Date |
|---|---|
| Real-time traceability method of width of defect based on divide-and-conquer App 20210312609 - Yang; Yongying ; et al. | 2021-10-07 |
| Surface defects evaluation system and method for spherical optical components Grant 10,444,160 - Yang , et al. Oc | 2019-10-15 |
| Surface defects evaluation system and method for spherical optical components App 20170292916 - Yang; Yongying ; et al. | 2017-10-12 |
| Wavelength scanning interferometer and method for aspheric surface measurement Grant 9,062,959 - Wang , et al. June 23, 2 | 2015-06-23 |
| Wavelength Scanning Interferometer And Method For Aspheric Surface Measurement App 20140218750 - WANG; KAIWEI ; et al. | 2014-08-07 |
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